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Mario Bendra; Roberto Lacerda Orio; Wolfgang Goes; Siegfried Selberherr; Viktor Sverdlov

Investigating Reliability Issues in Multi-Layered STT-MRAM with Synthetic Antiferromagnets Proceedings Article

In: 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp. 1-5, 2024.

Links | BibTeX | Tags: Couplings;Performance evaluation;Magnetic multilayers;Frequency modulation;Magnetization;Magnetic domains;Magnetic devices;reliability issues;spintronic devices;back-hopping;spin-transfer torques;interlayer exchange coupling;micromagnetics;synthetic anti-ferromagnetic