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M. Bendra; B. Pruckner; R. L. Orio; S. Selberherr; W. Goes; V. Sverdlov

Advancing Nonvolatile Memory Technologies: Enhancing Reliability and Performance through Double Spin Torque Magnetic Tunnel Junctions and Interlayer Exchange Coupling Proceedings Article

In: 2024 Device Research Conference (DRC), pp. 1-2, 2024.

Links | BibTeX | Tags: Performance evaluation;Couplings;Torque;Nonvolatile memory;Microprocessors;IEC;Computer architecture