M. Gritsch, H. Kosina, T. Grasser, and S. Selberherr.
Revision of the Standard Hydrodynamic Transport Model for SOI
Simulation.
IEEE Trans. Electron Devices, vol. 49, no. 10, pages 1814-1820, October 2002.
PDF
M. Gritsch, H. Kosina, T. Grasser, and S. Selberherr.
Simulation of a "Well Tempered" SOI MOSFET using an Enhanced
Hydrodynamic Transport Model.
In Proc. International Conference on Simulation of Semiconductor
Processes and Devices (SISPAD 2002), pages 195-198, Kobe, Japan, September 2002.
PDF,
Poster
M. Gritsch, H. Kosina, T. Grasser, S. Selberherr, T. Linton, S. Singh, S. Yu,
and M.D. Giles.
The Failure of the Hydrodynamic Transport Model for Simulation of
Partially Depleted SOI MOSFETs and its Revision.
In Proc. 5th Intl. Conf. on Modeling and Simulation of
Microsystems (MSM 2002), pages 544-547, San Juan, Puerto Rico, April 2002.
PDF
H. Kosina, M. Gritsch, T. Grasser, T. Linton, S. Yu, M.D. Giles, and
S. Selberherr.
An Improved Energy Transport Model Suitable for Simulation of
Partially Depleted SOI MOSFETs.
J.Comp.Electron., vol. 1, no. 2, 2002.
(In print).
PDF
M. Gritsch, H. Kosina, T. Grasser, and S.Selberherr.
Simulation of partially depleted SOI MOSFETs using an improved
hydrodynamic transport model.
In Proc. Physics of Semiconductor Devices (IWPSD 2001), pages
664-667, New Delhi, India, December 2001.
PDF
H. Kosina, M. Gritsch, T. Grasser, T. Linton, S. Yu, M.D. Giles, and
S. Selberherr.
An Improved Energy Transport Model Suitable for Simulation of
Partially Depleted SOI MOSFETs.
In Proc. 8th Intl. Workshop on Computational Electronics,
(IWCE-8), Urbana, Illinois, October 2001. Beckman Institute.
PDF,
Poster
T. Grasser, H. Kosina, M. Gritsch, and S. Selberherr.
Accurate Simulation of Substrate Currents by Accounting for the Hot
Electron Tail Population.
In H. Ryssel, G. Wachutka, and H. Grünbacher, editors, Proc.
31th European Solid-State Device Research Conference, pages 215-218,
Nuremberg, Germany, September 2001. Frontier Group.
PDF
T. Grasser, H. Kosina, M. Gritsch, and S. Selberherr.
Using Six Moments of Boltzmann's Transport Equation for Device
Simulation.
J. Appl. Phys., vol. 90, no. 5, pages 2389-2396, September 2001.
PDF
T. Grasser, H. Kosina, M. Gritsch, and S. Selberherr.
A Physics-Based Impact Ionization Model Using Six Moments of the
Boltzmann Transport Equation.
In Proc. 4th Intl. Conf. on Modeling and Simulation of
Microsystems (MSM 2001), pages 474-477, Hilton Head Island, South Carolina, USA, March
2001.
PDF
M. Gritsch, H. Kosina, T. Grasser, and S. Selberherr.
Influence of Generation/Recombination Effects in Simulations of
Partially Depleted SOI MOSFETs.
Solid-State Electron., vol. 45, no. 4, pages 621-627, 2001.
PDF,
online
M. Gritsch, H. Kosina, T. Grasser, and S.Selberherr.
A Simulation Study of Partially Depleted SOI MOSFETs.
In Proc. Silicon-On-Insulator Technology and Devices X (ECSSOI
2001), pages 181-186, Washington DC, USA, March 2001.
PDF
M. Gritsch, H. Kosina, C. Fischer, and S. Selberherr.
Influence of Generation/Recombination Effects in Simulations of
Partially Depleted SOI MOSFETs.
In Proc. European Meeting on Silicon on Insulator Devices
(EUROSOI 2000), Granada, Spain, October 2000.
PDF