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The simulation results are evaluated by visualization of the electric field using VTK.
In the presented example the simulation area consists of a SiO2 rectangular parallelepiped with the
conductors inside as shown in Fig. <6.23>. The faces parallel to the
plane are
defined as periodic boundary. At the remaining outer faces homogeneous Neumann boundary conditions
for the electrostatic potential are applied.
The simulated potential and the corresponding iso faces with periodic boundary conditions
are shown in Fig. <6.25> and Fig. <6.26>. The electric field
is equivalent to the electric field in an inner single cell of the original interconnect bus structure.
That is as if the simulation domain would be copied repeatedly in
and
direction by the length of its
dimension. The electric field looks like as if one boundary parallel to
plane would be directly
connected to the opposite one. The stamp of the electrodes which are lying on the one of the periodic
faces can be seen on the other periodic face. In order to visualize the effect of the periodic boundary
conditions, the same structure has been simulated with homogeneous Neumann boundary conditions (natural boundary
conditions) for comparison. The obtained electric potential distribution is displayed in
Fig. <6.27> and Fig. <6.28>. In this case the effect
of the opposite electrodes is no longer seen on the side walls and the iso surfaces are now perpendicular
to the boundary. The field in the simulation area is as if the simulation area would be mirrored with
respect to these boundaries.
Originally the
dimension of the simulation region is longer than this one shown in the figures.
For visualization
the simulation area is cut off perpendicularly to the
axis and closely to the electrodes to minimize
the mirronig effect of the homogeneous Neumann boundary conditions at the cutting planes, similarly to
Subsection 4.1.5.
As expected the calculated capacitance between the electrodes in the small area from
Fig. <6.23> is different for the different boundary conditions applied. The
capacitance with the periodic boundary is 1.33 times the capacitance with homogeneous Neumann
boundary. The capacitance of the whole area from Fig. <6.22> is the capacitance
of the small simulation domain multiplied by the number of all small simulation domains needed
to construct the complete structure.
Figure 6.22:
An interconnect bus.
|
Figure 6.23:
The simulation area.
|
Figure 6.24:
The electrodes in the simulation area.
|
Figure 6.25:
The electric potential
distribution with x periodicity.
|
Figure 6.26:
The iso faces of the electric potential
distribution with x periodicity.
|
Figure 6.27:
The electric potential distribution
without periodicity.
|
Figure 6.28:
The iso faces of the electric potential
distribution without periodicity.
|
Next: 7. Outlook
Up: 6.3 Periodic Boundaries
Previous: 6.3.1 Mesh Generation
Contents
A. Nentchev: Numerical Analysis and Simulation in Microelectronics by Vector Finite Elements