A similar RESURF effect can be achieved in multiple junction devices where an
additional layer of opposite doping (-top region in Figure 2.21) is incorporated
in the
-drift region. The main purpose of this structure is to increase the
optimum charge in the drift region without reducing the BV.
In such structures the vertical depletion
of the
-drift region is supported by two (or three) junctions.
Because of the multi vertical depletion in the device, the total
integrated charge
in the
-drift layer can be increased allowing the on-resistance
to be decreased compared to single-RESURF devices. In order to maintain
a high BV in the multi-RESURF devices, it is required that both the
-top and the
-drift regions are fully depleted.
Figure 2.21 shows the double RESURF lateral
diode which has two vertical junctions at the -substrate/
-drift
and
-top/
-drift.
Another approach to reduce the on-state resistance is to use dual conducting
paths in the
-drift.
Figure 2.22 shows the RESURF lateral device which has two
current path in the -drift. In this figure a
-buried layer is added inside of
the
-drift in the drift region. With this
-buried layer
-drift charge can be
increased compared to that of the double RESURF structure.
To decrease further the on-resistance
the highly doped and thin
-layer can be added on the top of the buried
-layer.
But the floating
-buried layer will give poor BV performance, it must be grounded
by contacting to the
-well.
By adding the -layer the
-buried layer doping has to be increased to achieve
charge balance in the off-state. This
-layer forms a current conduction
path which reduces the on-state resistance.
For the double-RESURF structure shown in Figure 2.21, it is essential
that the doping concentration of the
-top region (
) is sufficiently large
that
>
>
.The breakdown point is at
the lateral
-top junction with BV given by
![]() |
(2.11) |
As was stated earlier, in order to achieve a high BV in the
double-RESURF structure, full depletion of the -top and
-drift regions is
required. Here, just like in the case of single-RESURF devices, full depletion
should occur before the lateral
-top junction breaks down.
Therefore, in the double-RESURF case, the following conditions must be fulfilled
![]() |
(2.12) |
![]() |
(2.13) |
where
is the vertical depletion extension
into the
-top region at
,
is
the junction depth of the
-top region, respectively.
is
the vertical depletion extension into the
-drift region
from the
-top/
-drift junction and
is the vertical depletion extension into the
-drift region from the
-substrate/
-drift junction.
(2.12) prevents the structure from breaking down prematurely at the
lateral -top, whereas (2.13) guarantees the prevention
of a premature breakdown at the lateral
-drift junction.
With this structure the total charge in the
-drift region can be increased twice
as much as in single-RESURF structure, leading to a much lower on-resistance.
Jong-Mun Park 2004-10-28