Symbol | Definition | Description |
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Maximum electric far field density |
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Differential mode current |
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Frequency |
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Surface area, loop area |
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Distance from Source point to field observation point |
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Parallel plane separation distance |
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Relative dielectric constant of the material |
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Noise current |
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Width of rectangular parallel planes (y-dimension) |
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Length of rectangular parallel planes (x-dimension) |
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Quality factor of a resonator |
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Conductivity |
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Loss tangent |
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Resonance frequency |
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Positive integer values |
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Maximum radiated electric far field from an antenna |
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Antenna feed point current |
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Antenna feed point voltage |
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Resistances in a circuit |
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Coupling resistance |
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Common mode current |
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Supply (battery) voltage |
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Measurement voltage |
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Coupling capacitance |
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Self inductances of two loops |
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Mutual inductance of two loops |
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Coupling inductance of two loops |
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Stray inductances of two loops |
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Electric field density |
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Magnetic field density |
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Electric current density |
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Permittivity of a material |
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Permeability of a material |
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Imaginary unit: ![]() |
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Integer index |
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Angular frequency: ![]() |
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x-direction component of ![]() |
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y-direction component of ![]() |
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z-direction component of ![]() |
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lossless wave number:
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Parallel plane inductance |
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Capacitance per parallel plane area |
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Plane thickness of metal plane i |
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Skin depth of metal plane i |
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Parallel plane resistance |
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Parallel plane conductance |
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z-direction component of ![]() |
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Boundary curve of a parallel plane structure |
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Parallel plane voltage at position
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Mutual plane impedance matrix element |
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Effective width of rectangular parallel planes |
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Effective length of rectangular parallel planes |
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Rectangular parallel plane eigenvalue of x-direction |
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Rectangular parallel plane eigenvalue of y-direction |
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Wave number |
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Two dimensional fourier series coefficient |
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Position of port with index i on parallel planes |
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Position of port with index j on parallel planes |
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Parallel plane discretization for LCR grid method |
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Approximate parallel plane voltage distribution |
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Residuum (Approximation error) of ![]() |
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Finite element weighting function |
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Finite element base functions |
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Nodal approximation of the parallel plane voltage |
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Barycentric (triangular) coordinates of triangle i |
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Area of the triangle with index i |
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System matrix |
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Approximate solution vector |
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Excitation vector |
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Solution vector normal derivation |
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Boundary weighting matrix |
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System matrix elements |
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Excitation vector elements |
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Parallel plane impedance matrix |
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Measurement port current |
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Trace current at the source position |
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Trace current at the load position |
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Trace to cavity coupling factor |
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Characteristic trace impedance |
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Trace propagation constant |
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Trace load impedance |
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Effective trace length |
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Horizontal trace length |
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Trace distance from the ground plane |
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Capacitance of trace and cover |
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Capacitance of cover and ground plane |
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Capacitance of trace and ground plane |
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Coupling factor from mode decomposition |
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Electrostatic potential |
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Analytical coupling factor |
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Plane voltage of model with a trace |
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Trace width |
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Permittivity of vacuum |
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Field scan height above the ground plane |
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Complex scanned current density |
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Components of complex, scanned current density |
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Coupling factor in scan height |
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Coupling constants |
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Median coupling factor of an IC interconnect path |
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Distance to ground of IC interconnect segment i |
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Length of interconnect segment i |
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Common mode voltage |
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Common mode inductance of a trace above ground |
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Common mode inductance of a trace between two planes |
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Differential voltage at opposite plane ports |
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Coupling inductance from a trace to parallel planes |
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Measured common mode inductance |
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Transfer impedance |
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Surface normal vector |
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Parallel plane excitation current |
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Parallel plane voltage at mode m,n |
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Source term of parallel plane voltage |
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Observation point term of parallel plane voltage |
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Resonances of rectangular power planes |
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Magnetic vector potential |
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Electric vector potential |
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Vector from origin to field observation point |
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Vector from origin to source point |
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Vector from source to field observation point |
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Active antenna dimension |
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Angle between ![]() ![]() |
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Magnetic current density |
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Approximate electric far field density |
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Approximate magnetic far field density |
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Wavelength in vacuum |
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Pointing vector |
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Pointing vector of ports with indexes c and r |
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Admittance matrix elements |
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Measurement voltage vector |
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Interface port voltage vector |
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Radiation admittance matrix |
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Condition number of matrix
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Minimum eigenvalue of matrix
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Maximum eigenvalue of matrix
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Threshold value for matrix condition number |
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Emission reduction estimation for d reduction |
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Emission reduction estimation for shielding |
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Emission reduction estimation for ground under an IC |
C. Poschalko: The Simulation of Emission from Printed Circuit Boards under a Metallic Cover