Our review paper entitled “Reliability of Minaturized Transistors from the Perspective of Single-Defects” has been accepted for publication in Micromachines Journal.
Michael Waltl | Single-Defect Spectroscopy in Semiconductor Devices
Christian Doppler Laboratory at the Institue for Microelectronics
Our review paper entitled “Reliability of Minaturized Transistors from the Perspective of Single-Defects” has been accepted for publication in Micromachines Journal.