Our paper entitled “Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors” has been accepted for publication in IEEE Transactions of Device and Material Reliability and will be available online soon.
Michael Waltl | Single-Defect Spectroscopy in Semiconductor Devices
Christian Doppler Laboratory at the Institue for Microelectronics
Our paper entitled “Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors” has been accepted for publication in IEEE Transactions of Device and Material Reliability and will be available online soon.