Markus Kampl was born in Vienna, Austria, in 1988. He studied electrical engineering at the TU Wien, where he joined the Institute for Microelectronics in October 2012. He received the degree of Diplomingenieur and the PhD in November 2015, respectively April 2019. Currently, Markus is a Postdoctoral researcher in the CDL for Single-Defect Spectroscopy and his work focuses on developing a simulation framework to calculate the carrier mobility in power MOSFETs.