Christoph Kandolf was born in Innsbruck, Austria in 1990. He studied at the TU Wien where he received the BSc degree in Electrical Engineering (2015) and the Diplomingenieur degree in Microelectronics and Photonics (2019). He joined the Institute for Microelectronics in May 2019, where he is currently working on his doctoral degree towards characterization and modeling of defects in transistors employing 2D materials.