Roberto Lacerda de Orio studied electrical engineering at the University of Campinas (UNICAMP), Brazil, where he received his Bachelor degree in 2005 and his Master degree with emphasis on Microelectronics in 2006. He joined the Institute for Microelectronics in October 2006, where he received his doctoral degree in 2010 and worked as a post-doctoral researcher until 2013, with a focus on reliability issues in interconnects of integrated circuits. From 2014 to 2018 he was a tenured Assistant Professor at the Faculty of Electrical and Computer Engineering (FEEC) of UNICAMP, where he carried out research, teaching, and supervision activities of students at all academic levels in the area of micro- and nanoelectronics, mainly on topics related to the reliability of integrated circuits as well as the modeling, simulation, and fabrication of semiconductor devices. He was a Principal Investigator in research funded projects and also acted as Deputy Head of the Department of Semiconductors, Instruments and Photonics at FEEC/UNICAMP. In October 2018 he rejoined the Institute for Microelectronics as a research scientist (Postdoc) working on non-volatile magnetoresistive memory devices and supporting teaching activities. He has many years of experience in developing numerical simulation tools for micro- and nanoelectronic devices with programming skills in Python, C, and C++. Roberto is currently a Senior Scientist and is supporting the research related to robustness of electronic circuits, with a focus on the analysis of semiconductor physical phenomena and their reliability. He is also involved in lecturing for the Bachelor and Master programs at the Institute for Microelectronics, which includes programming in C, microelectronic devices simulation, modeling of electronic devices, and simulation of semiconductor devices fabrication.