Bernhard Stampfer, born in 1989 in Austria, studied at the Technische Universität Wien where he received the Bachelor’s degree (BSc) in Electrical Engineering (2013), the Diplomingenieur degree (Dipl.-Ing., MSc equivalent) in Microelectronics and Photonics (2016) and the Doctoral degree (Dr.techn., PhD equivalent) in 2020. Bernhard is employed at the Institute for Microelectronics as a post-doctoral researcher and his work is focused on the characterization of defects in semiconductor devices.