Tobias Zinsler is enrolled in the bachelor's program of electrical engineering and information technology at the TU Wien. During his bachelor's thesis, he was working on expanding a measurement data processing program that provides state-of-the-art evaluation methods for the defect spectroscopy of thin-film MOSFETs. As a student employee, Tobias will work at the IuE in the SDS team and will continue to optimize data processing algorithms implemented in our software tools.