Professors
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Application of 2D Semiconductors in Conductometric Sensors | ![]() |
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Numerical Modeling of Nanostructured Semiconductor Devices | ![]() |
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Modeling Coulomb Interaction with a Wigner-Poisson Coupling Scheme | ![]() |
Administration
Researchers
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A Finite Element Method Approach to MRAM Modeling: Verification and Calibration | ![]() |
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Improving Spin-Orbit Torque Memory Cell Switching With the Help of Reinforcement Learning | ![]() |
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Coupled Spin and Charge Drift-Diffusion Approach Applied to Magnetic Tunnel Junctions | ![]() |
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Performance Limits of Hexagonal Boron Nitride for Scaled CMOS Devices Based on 2D Materials | ![]() |
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Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: A Modeling Approach | ![]() |
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Robust and Efficient Approximation of Potential Energy Surfaces using Gaussian Process Regression | ![]() |
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Reduced Current Spin-Orbit Torque Switching of a Perpendicularly Magnetized Free Layer | ![]() |
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A Parallel Velocity Extension for Level-Set-Based Material Flow on Hierarchical Meshes in Process TCAD | ![]() |
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Parallelization Strategies for Linear and Nonlinear Solvers for the Boltzmann Equation | ![]() |
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Adaptive Importance Sampling for Top-Down Monte Carlo Flux Calculations | ![]() |
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Statistical Characterization of Defects Causing Random Telegraph Noise | ![]() |
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Continuum Level-Set Model for Anisotropic Wet Etching of Patterned Sapphire Substrates | ![]() |
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Modeling the Hysteresis of Current-Voltage Characteristics in Planar 4H-SiC MOSFETs | ![]() |
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Automated Defect Characterization Based on BTI Measurements | ![]() |
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Analysis of Electron and Hole Trapping Components in SiON Transistors | ![]() |