• [BK-1] Ferry, David, K., Oriols, Xavier, Weinbub, Josef:
  "Quantum Transport in Semiconductor Devices: Simulation Using Particles";
  Ferry, David, K., Oriols, Xavier, Weinbub, Josef (2023-11-01). Quantum Transport in Semiconductor Devices: Simulation Using Particles. IOP Publishing. ISBN: 978-0-7503-5237-6, 978-0-7503-5234-5.
  
  

• [PJ-51] Jorstad, Nils, P., Fiorentini, Simone, Ender, Johannes, Wolfgang, G., Selberherr, Siegfried, Sverdlov, Viktor:
  "Micromagnetic modeling of SOT-MRAM dynamics";
  PHYSICA B-CONDENSED MATTER, 676 (2024-03-01).
  
  
• [PJ-50] Hadamek, Tomas, Jorstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Numerical study of two-terminal SOT-MRAM";
  Physica B: Condensed Matter, 673, 1–6 (2024-01-15).
  
  
• [PJ-49] Shayanfar, Reza, Alidoosti, Mohammad, Nasr, E., Davoud, Pourfath, Mahdi:
  "The carrier mobility and superconducting properties of monolayer oxygen-terminated functionalized MXene Ti₂CO₂";
  Nanoscale, 15(46), 18806–18817 (2023-12-14).
  
  
• [PJ-48] Bendra, Mario, Fiorentini, Simone, Selberherr, Siegfried, Gös, Wolfgang, Sverdlov, Viktor:
  "A multi-level cell for ultra-scaled STT-MRAM realized by back-hopping";
  Solid-State Electronics, 208 (2023-10-01).
  
  
• [PJ-47] Gull, Josef, Kosina, Hans:
  "Monte Carlo study of electron–electron scattering effects in FET channels";
  Solid-State Electronics, 208 (2023-10-01).
  
  
• [PJ-46] Souza, B. R., Francio, Aguinsky, Luiz, F., Lenz, Christoph, Hössinger, Andreas, Weinbub, Josef:
  "3D modeling of feature-scale fluorocarbon plasma etching in silica";
  Journal of Computational Electronics, 22(5), 1558–1563 (2023-10-01).
  
  
• [PJ-45] Shobeyrian, F., Shojaei, F., Soleimani, M., Pourfath, M.:
  "Two-dimensional Cr₂X₂Y₆ (X = Si, Ge; Y = S, Se, Te) family with potential application in photocatalysis";
  Applied Surface Science, 630 (2023-09-01).
  
  
• [PJ-44] Ceric, Hajdin, Lacerda, d. O., Roberto, Selberherr, Siegfried:
  "Statistical Study of Electromigration in Gold Interconnects";
  Microelectronics Reliability, 147, 1–7 (2023-08-01).
  
  
• [PJ-43] Hadamek, Tomas, Jorstad, Nils, P., Lacerda, d. O., Roberto, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "A Comprehensive Study of Temperature and Its Effects in SOT-MRAM Devices";
  Micromachines, 14(8), 1–14 (2023-08-01).
  
  
• [PJ-42] Akhound, M.A., Soleimani, M., Pourfath, M.:
  "Controllable Gas Adsorption via Inter-Coupled Ferroelectricity in In₂Se₃ Monolayer";
  Materials Today Chemistry, 31 (2023-07-03).
  
  
• [PJ-41] Zarate-Galvez, Sarai, Garcia-Barrientos, Abel, Lastras-Martinez, Luis, F., Cardenas-Juarez, Marco, Macias-Velasquez, Sharon, Filipovic, Lado, Arce-Casas, Armando:
  "Optimization of Doping Concentration to Obtain High Internal Quantum Efficiency and Wavelength Stability in An InGaN/GaN Blue Light-Emitting Diode";
  ECS Journal of Solid State Science and Technology, 12(7) (2023-07-01).
  
  
• [PJ-40] Medina-Bailon, Cristina, Nedialkov, Mihail, H., Georgiev, Vihar, Selberherr, Siegfried, Asenov, Asen:
  "Comprehensive mobility study of silicon nanowire transistors using multi-subband models";
  Nano Express, 4(2) (2023-06-01).
  
  
• [PJ-39] HosseinpourRokni, Mohsen, Naderi, Reza, Soleimani, Maryam, Kowsari, Elaheh, Pourfath, Mahdi:
  "Indirect interactions between the ionic liquid and Cu surface in 0.5 M HCl: a novel mechanism explaining cathodic corrosion inhibition";
  Corrosion Science, 216 (2023-05-15).
  
  
• [PJ-38] Leroch, S., Eder, Stefan, Varga, M., Rodríguez, R., M.:
  "Material point simulations as a basis for determining Johnson–Cook hardening parameters via instrumented scratch tests";
  International Journal of Solids and Structures, 267 (2023-04-01) doi:10.34726/3547.
  
  
• [PJ-37] Bobinac, Josip, Reiter, Tobias, Piso, Julius, Klemenschits, Xaver, Baumgartner, Oskar, Stanojevic, Zlatan, Strof, Georg, Karner, Markus, Filipovic, Lado:
  "Effect of Mask Geometry Variation on Plasma Etching Profiles";
  Micromachines, 14(3) (2023-03-16).
  
  
• [PJ-36] Ceric, Hajdin, Zahedmanesh, Houman, Croes, Kristof, Lacerda, d. O., Roberto, Selberherr, Siegfried:
  "Electromigration-Induced Void Evolution and Failure of Cu/SiCN Hybrid Bonds";
  Journal of Applied Physics, 133(10) (2023-03-14).
  
  
• [PJ-35] Soleimani, Maryam, Pourfath, Mahdi:
  "A comprehensive investigation of the plasmonic-photocatalytic properties of gold nanoparticles for CO₂ conversion to chemicals";
  Nanoscale, 15(15), 7051–7067 (2023-03-02).
  
  
• [PJ-34] Bendra, Mario, Fiorentini, Simone, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "The Influence of Interface Effects on the Switching Behavior in Ultra-Scaled MRAM Cells";
  Solid-State Electronics, 201 (2023-03-01).
  
  
• [PJ-33] Aguinsky, Luiz, F., Souza, B. R., Francio, Reiter, Tobias, Klemenschits, Xaver, Filipovic, Lado, Hössinger, Andreas, Weinbub, Josef:
  "Modeling Incomplete Conformality During Atomic Layer Deposition in High Aspect Ratio Structures";
  Solid-State Electronics, 201 (2023-03-01).
  
  
• [PJ-32] Lenz, Christoph, Aguinsky, Luiz, F., Hössinger, Andreas, Weinbub, Josef:
  "A Complementary Topographic Feature Detection Algorithm Based on Surface Curvature for Three-Dimensional Level-Set Functions";
  Journal of Scientific Computing, 94(3) (2023-03-01).
  
  
• [PJ-31] Lenz, Christoph, Aguinsky, Luiz, F., Hössinger, Andreas, Weinbub, Josef:
  "A Complementary Topographic Feature Detection Algorithm Based on Surface Curvature for Three-Dimensional Level-Set Functions";
  Journal of Scientific Computing, 94(3), 1–21 (2023-02-08).
  
  
• [PJ-30] Dehdast, Mahyar, Neek-Amal, Mehdi, Stampfl, Catherine, Pourfath, Mahdi:
  "Strain engineering of hyperbolic plasmons in monolayer carbon phosphide: a first-principles study";
  Nanoscale, 15(5), 2234–2247 (2023-02-07).
  
  
• [PJ-29] Leroch, S., Grützmacher, Philipp, Heckes, H., Eder, Stefan:
  "Towards a multi-abrasive grinding model for the material point method";
  Frontiers in Manufacturing Technology, 3 (2023-02-03).
  
  
• [PJ-28] Ceric, Hajdin, Lacerda, d. O., Roberto, Selberherr, Siegfried:
  "Microstructural impact on electromigration reliability of gold interconnects";
  Solid-State Electronics, 200 (2023-02-01).
  
  
• [PJ-27] Hadamek, Tomas, Selberherr, Siegfried, Wolfgang, G., Sverdlov, Viktor:
  "Modeling Thermal Effects in STT-MRAM";
  Solid-State Electronics, 200 (2023-02-01).
  
  
• [PJ-26] Filipovic, Lado, Baumgartner, Oskar, Klemenschits, Xaver, Piso, Julius, Bobinac, Josip, Reiter, Tobias, Strof, Georg, Rzepa, Gerhard, Stanojevic, Zlatan, Karner, Markus:
  "DTCO flow for air spacer generation and its impact on power and performance at N7";
  Solid-State Electronics, 199 (2023-01-01).
  
  
• [PJ-25] Fiorentini, Simone, Ender, Johannes, Selberherr, Siegfried, Lacerda, d. O., Roberto, Goes, Wolfgang, Sverdlov, Viktor:
  "Comprehensive evaluation of torques in ultra-scaled MRAM devices";
  Solid-State Electronics, 199 (2023-01-01).
  
  
• [PJ-24] Achleitner, Franz, Arnold, Anton, Mehrmann, Volker:
  "Hypocoercivity and hypocontractivity concepts for linear dynamical systems";
  ELECTRONIC JOURNAL OF LINEAR ALGEBRA, 39, 33–61 (2023-01-01).
  
  
• [PJ-23] Garcia-Barrientos, Abel, Nikolova, Natalia, Filipovic, Lado, Gutierez-D., Edmundo, A., Serrano, Victoria, Macias-Velasquez, Sharon, Zarate-Galvez, Sarai:
  "Numerical simulations of space charge waves amplification using negative differential conductance in strained Si/SiGe at 4.2 K";
  Crystals, 13(9) (2023-01-01).
  
  
• [PJ-22] Fiorentini, Simone, Lacerda, d. O., Roberto, Ender, Johannes, Selberherr, Siegfried, Bendra, Mario, Jorstad, Nils, P., Goes, Wolfgang, Sverdlov, Viktor:
  "Finite Element Method for MRAM Switching Simulations";
  WSEAS Transactions on Systems and Controls, 17, 585–588 (2022-12-31).
  
  
• [PJ-21] Fiorentini, Simone, Bendra, Mario, Ender, Johannes, Lacerda, d. O., Roberto, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Spin and charge drift-diffusion in ultra-scaled MRAM cells";
  Scientific Reports, 12 (2022-12-05).
  
  
• [PJ-20] Filipovic, Lado, Selberherr, Siegfried:
  "Application of two-dimensional materials towards CMOS-integrated gas sensors";
  Nanomaterials, 12(20) (2022-10-02).
  
  
• [PJ-19] Nazzari, Daniele, Genser, Jakob, A., Ritter, Viktoria, Bethge, Ole, Bertagnolli, Emmerich, Grasser, Tibor, Weber, Walter, M., Lugstein, Alois:
  "Epitaxial Growth of Crystalline CaF₂ on Silicene";
  ACS Applied Materials and Interfaces, 14(28), 32675–32682 (2022-07-20).
  
  
• [PJ-18] Knobloch, Theresia, Uzlu, Burkay, Illarionov, Yury, Wang, Zhenxing, Otto, Martin, Filipovic, Lado, Waltl, Michael, Neumaier, Daniel, Lemme, Max, C., Grasser, Tibor:
  "Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuning";
  Nature Electronics, 5(6), 356–366 (2022-06-01).
  
  
• [PJ-17] Bendra, Mario, Fiorentini, Simone, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "The influence of interface effects on the switching behavior in ultra-scaled MRAM cells";
  Solid-State Electronics, 201 (2022-03-01).
  
  
• [PJ-16] Hadámek, T., Fiorentini, S., Bendra, M., Ender, J., de, O., R.L., Goes, W., Selberherr, S., Sverdlov, V.:
  "Temperature Increase in STT-MRAM at Writing: A Fully Three-Dimensional Finite Element Approach";
  Solid-State Electronics, 193(108269) (2022-01-01).
  
  
• [PJ-15] Loch, Wilton, J., Fiorentini, Simone, Jørstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Double Reference Layer STT-MRAM Structures with Improved Performance";
  Solid-State Electronics, 194(108335) (2022-01-01).
  
  
• [PJ-14] Jørstad, Nils, P., Fiorentini, Simone, Loch, Wilton, J., Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Finite Element Modeling of Spin-Orbit Torques";
  Solid-State Electronics, 194 (2022-01-01).
  
  
• [PJ-13] Bendra, M., Fiorentini, S., Goes, W., Selberherr, S., Sverdlov, V.:
  "Interface Effects in Ultra-Scaled MRAM Cells";
  Solid-State Electronics, 194(108373) (2022-01-01).
  
  
• [PJ-12] Waltl, Michael, Knobloch, Theresia, Tselios, Konstantinos, Filipovic, Lado, Stampfer, Bernhard, Hernandez, Yoanlys, Waldhör, Dominic, Illarionov, Yury, Kaczer, Ben, Grasser, Tibor:
  "Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?";
  Advanced Materials, 34(48) (2022-01-01).
  
  
• [PJ-11] Wilhelmer, Christoph, Waldhoer, Dominic, Jech, Markus, El-Sayed, Al-Moatasem, B., Cvitkovich, Lukas, Waltl, Michael, Grasser, Tibor:
  "Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture";
  Microelectronics Reliability, 139(114801) (2022-01-01).
  
  
• [PJ-10] Fiorentini, Simone, Ender, Johannes, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Spin Transfer Torque Evaluation Based on Coupled Spin and Charge Transport: A Finite Element Method Approach";
  Journal on Systemics, Cybernetics and Informatics, 20(4), 40–44 (2022-01-01).
  
  
• [PJ-9] Waltl, Michael, Waldhör, Dominic, Tselios, Konstantinos, Stampfer, Bernhard, Schleich, Christian, Rzepa, Gerhard, Enichlmair, Hubert, Ioannidis, Eleftherios, G., Minixhofer, Rainer, Grasser, Tibor:
  "Impact of single-defects on the variability of CMOS inverter circuits";
  Microelectronics Reliability, 126, 1–6 (2021-11-01).
  
  
• [PJ-8] Ender, Johannes, Lacerda, d. O., Roberto, Fiorentini, Simone, Selberherr, Siegfried, Goes, W., Sverdlov, Viktor:
  "Improving failure rates in pulsed SOT-MRAM switching by reinforcement learning";
  Microelectronics Reliability, 126, 1–5 (2021-11-01).
  
  
• [PJ-7] Filipovic, Lado:
  "Theoretical examination of thermo-migration in novel platinum microheaters";
  Microelectronics Reliability, 123, 1–14 (2021-08-01).
  
  
• [PJ-6] Ansaripour, Iman, Pourfath, Mahdi:
  "Charge-Induced Two-Step Structural Phase Transition in the MoTe₂–WSeTe Hetero-Bilayer";
  JOURNAL OF PHYSICAL CHEMISTRY C, 125(27), 15000–15011 (2021-07-15).
  
  
• [PJ-5] Tselios, Konstantinos, Waldhör, Dominic, Stampfer, Bernhard, Michl, Jakob, Ioannidis, Eleftherios, Enichlmair, H., Grasser, Tibor, Waltl, Michael:
  "On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors";
  IEEE Transactions on Device and Materials Reliability, 21(2), 199–206 (2021-01-01).
  
  
• [PJ-4] Waldhoer, Dominic, Schleich, Christian, Michl, Jakob, Stampfer, Bernhard, Tselios, Konstantinos, Ioannidis, Eleftherios, G., Enichlmair, Hubert, Waltl, Michael, Grasser, Tibor:
  "Toward Automated Defect Extraction From Bias Temperature Instability Measurements";
  IEEE Transactions on Electron Devices, 68(8), 4057–4063 (2021-01-01).
  
  
• [PJ-3] Waltl, Michael, Waldhoer, Dominic, Tselios, Konstantinos, Stampfer, Bernhard, Schleich, Christian, Rzepa, Gerhard, Enichlmair, Hubert, Ioannidis, Eleftherios, G., Minixhofer, Rainer, Grasser, Tibor:
  "Impact of Single-Defects on the Variability of CMOS Inverter Circuits";
  Microelectronics Reliability, 126(114275) (2021-01-01).
  
  
• [PJ-2] Jech, Markus, El-Sayed, Al-Moatasem, B., Tyaginov, Stanislav, Shluger, Alexander, L., Grasser, Tibor:
  "Ab Initio treatment of silicon-hydrogen bond rupture at Si/SiO₂ interfaces";
  Physical Review B, 100(19) (2019-11-15).
  
  
• [PJ-1] Gnam, Lukas, Manstetten, Paul, Hössinger, Andreas, Selberherr, Siegfried, Weinbub, Josef:
  "Accelerating Flux Calculations Using Sparse Sampling";
  Micromachines, 9(11), 1–18 (2018-11-01).
  
  

• [BC-3] Selberherr, Siegfried, Sverdlov, Viktor:
  "Technology Computer-Aided Design: A Key Component of Microelectronics' Development";
  Selberherr, Siegfried, Sverdlov, Viktor (2023-07-03). Technology Computer-Aided Design: A Key Component of Microelectronics' Development. In Nathan, Arokia, Saha, Samar, K., Todi, Ravi, M. (Eds.), 75^th Anniversary of the Transistor (pp. 337–347). Wiley: Hoboken, New Jersey, ISBN: 978-1-394-20244-7.
  
  
• [BC-2] Cervenka, Johann, Kosik, Robert, Vasicek, Martin-Thomas, Gritsch, Markus, Selberherr, Siegfried, Grasser, Tibor:
  "Macroscopic Transport Models for Classical Device Simulation";
  Cervenka, Johann, Kosik, Robert, Vasicek, Martin-Thomas, Gritsch, Markus, Selberherr, Siegfried, Grasser, Tibor (2023-01-01). Macroscopic Transport Models for Classical Device Simulation. In Rudan, Massimo, Brunetti, Rossella, Reggiani, Susanna (Eds.), Springer Handbook of Semiconductor Devices (pp. 1335–1381). Springer: Cham, ISBN: 978-3-030-79826-0.
  
  
• [BC-1] Sverdlov, Viktor, Selberherr, Siegfried:
  "Spin-Based Devices for Digital Applications";
  Sverdlov, Viktor, Selberherr, Siegfried (2022-01-01). Spin-Based Devices for Digital Applications. In Rudan, Massimo, Brunetti, Rossella, Reggiani, Susanna (Eds.), Springer Handbook of Semiconductor Devices (pp. 1123–1166). Springer International Publishing: Cham, Switzerland, ISBN: 978-3-030-79826-0.
  
  

• [CP-72] Sokolovic, Igor, Rasouli, Saeed, Wu, Bing, Sofer, Zdeněk, Matković, Aleksandar, Schmid, Michael, Diebold, Ulrike, Grasser, Tibor:
  "PtSe₂ vdW single-crystal surfaces studied at the atomic scale with ncAFM";
  Talk: In 87. Jahrestagung der DPG und DPG-Frühjahrstagung Berlin, DE.
  
  
• [CP-71] Sokolovic, Igor, Guedes, Eduardo, van, W., Thomas, Poncé, Samuel, Polley, Craig, Schmid, Michael, Diebold, Ulrike, Radović, Milan, Setvin, Martin, Dil, Hugo:
  "Two-dimensional electron liquids at truly bulk-terminated SrTiO₃";
  Talk: In 87. Jahrestagung der DPG und DPG-Frühjahrstagung Berlin, DE.
  
  
• [CP-70] Bendra, Mario, Jorstad, Nils, P., Lacerda, d. O., Roberto, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Unified Modeling of Ultra-Scaled STT-MRAM Cells: Harnessing Parasitic Effects for Enhanced Data Storage Dynamics";
  Talk: In IEDM 2023 Special MRAM poster session San Francisco, US.
  
  
• [CP-69] Jorstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Spin Drift-Diffusion Boundary Conditions for FEM Modeling of Multilayer SOT Devices";
  Talk: In Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 357–360), Kobe, JP.
  
  
• [CP-68] Filipovic, Lado, Bobinac, Josip, Piso, Julius, Reiter, Tobias:
  "Physics-Informed Compact Model for SF6/O2 Plasma Etching";
  Talk: In 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 73–76), Kobe, JP.
  
  
• [CP-67] Reiter, Tobias, Toifl, Alexander, Hössinger, Andreas, Filipovic, Lado:
  "Modeling Oxide Regrowth During Selective Etching in Vertical 3D NAND Structures";
  Talk: In 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 85–88), Kobe, JP.
  
  
• [CP-66] Wilhelmer, Christoph, Waldhör, Dominic, Milardovich, Diego, Cvitkovich, Lukas, Waltl, Michael, Grasser, Tibor:
  "Intrinsic Electron Trapping in Amorphous Silicon Nitride (a-Si3N4:H)";
  Talk: In 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 149–152), Kobe, JP.
  
  
• [CP-65] Hadamek, Tomas, Jorstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Study of Self-Heating and its Effects in SOT-STT-MRAM";
  Talk: In 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 337–340), Kobe, JP.
  
  
• [CP-64] Leroch, Sabine, Stella, Robert, Hössinger, Andreas, Filipovic, Lado:
  "Molecular Dynamics Study of Al Implantation in 4H-SiC";
  Talk: In 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (pp. 185–188), Kobe, JP.
  
  
• [CP-63] Achleitner, Franz, Arnold, Anton, Carlen, Eric, Jüngel, Ansgar, Mehrmann, Volker:
  "The Hypocoercivity Index for the short time behavior of linear time-invariant ODE systems";
  Talk: In ÖMG Tagung 2023 Meeting of the Austrian Mathematical Society Karl-Franzens-University (KFU), Graz, AT.
  
  
• [CP-62] Olivares, Stefano, Weinbub, Josef:
  "IWW International Wigner Workshop 2023: Book of Abstracts";
  Talk: In unknown, unknown.
  
  
• [CP-61] Sverdlov, Viktor, Jorstad, Nils, P., Bendra, Mario, Hadamek, Tomas, Goes, Wolfgang:
  "Modeling Emerging Spintronic Devices and Spintronic THz Emitters";
  Talk: In Book of abstracts of the International Symposium on Terahertz-Related Devices and Technologies (TeraTech 2023) (pp. 50–51), Aizu-Wakamatsu, JP.
  
  
• [CP-60] Aguinsky, Luiz, F., Toifl, Alexander, Souza, B. R., Francio, Hössinger, Andreas, Weinbub, Josef:
  "A Modern Formulation of Knudsen Diffusion with Applications to Nanofabrication";
  Talk: In 2023 IEEE 23rd International Conference on Nanotechnology (NANO) (pp. 270–275), Jeju City, KP.
  
  
• [CP-59] Pruckner, Bernhard, Fiorentini, Simone, Jorstad, Nils, P., Hadamek, Tomas, Selberherr, Siegfried, Gös, Wolfgang, Sverdlov, Viktor:
  "Switching Performance of Mo-based pMTJ and dsMTJ Structures";
  Talk: In Book of Abstracts of the International Workshop on Computational Nanotechnology (pp. 144–145), Barcelona, ES.
  
  
• [CP-58] Ballicchia, Mauro, Nedjalkov, Mihail, Weinbub, Josef:
  "Coherent Wigner Dynamics of a Superposition State in a Tunable Barrier Quantum Dot";
  Talk: In Book of Abstracts of the International Workshop on Computational Nanotechnology 2023 (IWCN) (pp. 90–91), Barcelona, ES.
  
  
• [CP-57] Wilhelmer, Christoph, Waldhör, Dominic, Cvitkovich, Lukas, Waltl, Michael, Grasser, Tibor:
  "Ab initio investigations of electron and hole trapping processes of H induced defects in amorphous SiO₂";
  Talk: In The 14th International Conference on SiO₂, Dielectrics and Related Devices : Book of Abstracts (pp. 18–19), Palermo, IT.
  
  
• [CP-56] Ballicchia, Mauro, Nedjalkov, Mihail, Weinbub, Josef:
  "Gauge-Invariant Wigner Particle Model for Linear Electromagnetic Fields";
  Talk: In Book of Abstracts: IWW International Wigner Workshop 2023 (pp. 3–5), Barcelona, ES.
  
  
• [CP-55] Ender, Johannes, Lacerda, d. O., Roberto, Goes, Wolfgang, Sverdlov, Viktor:
  "Towards Efficient SOT-assisted STT-MRAM Cell Switching using Reinforcement Learning";
  Talk: In 14th International Conference, Large-Scale Scientific Computations LSSC'23 : Scientific Program, Abstracts, List of Participants (pp. 39–39), Sozopol, BG.
  
  
• [CP-54] Jorstad, Nils, P., Fiorentini, Simone, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Micromagnetic Modeling of SOT-MRAM Dynamics";
  Talk: In Digital Book of Abstracts: 13th International Symposium on Hysteresis Modeling and Micromagnetics (HMM 2023) (pp. 1–1), Vienna, AT.
  
  
• [CP-53] Pruckner, Bernhard, Fiorentini, Simone, Goes, Wolfgang, Sverdlov, Viktor:
  "Impact of Spin-Flip Length in dsMTJ Spacer Layers on Switching Performance";
  Poster: In Digital Book of Abstracts: 13th International Symposium on Hysteresis Modeling and Micromagnetics (HMM 2023) (pp. 1–1), Vienna, AT.
  
  
• [CP-52] Bendra, Mario, Fiorentini, Simone, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Simulation of Spin-Torque and Magnetization Dynamics in STT-MRAM Multi-Level Cells";
  Poster: In Digital Book of Abstracts: 13th International Symposium on Hysteresis Modeling and Micromagnetics (HMM 2023) (pp. 1–1), Vienna, AT.
  
  
• [CP-51] Wilhelmer, Christoph, Milardovich, Diego, Waldhör, Dominic, Cvitkovich, Lukas, Waltl, Michael, Grasser, Tibor:
  "Intrinsic Charge Trapping Sites in Amorphous Si₃N₄";
  Talk: In European Materials Research Society (E-MRS) Spring Meeting 2023 Strasbourg, FR.
  
  
• [CP-50] Fiorentini, Simone, Pruckner, Bernhard, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Accurate Torque Evaluation in Elongated Ultra-Scaled STT-MRAM Devices";
  Talk: In 243rd ECS Meeting with the Eighteenth International Symposium on Solid Oxide Fuel Cells May 28, 2023 - June 2, 2023 Boston, USA (pp. 1–1), Boston, MA, US.
  
  
• [CP-49] Bendra, Mario, Fiorentini, Simone, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "A Multi-Level Cell for Ultra-Scaled STT-MRAM Realized by Back-Hopping";
  Talk: In 9th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) 2023 (pp. 1–2), Tarragona, ES.
  
  
• [CP-48] Gull, Josef, Kosina, Hans:
  "Monte-Carlo Investigation of Energy Distributions in FET Channels";
  Talk: In 9th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) : Programme Tarragona, ES.
  
  
• [CP-47] Hadamek, Tomas, Bendra, Mario, Fiorentini, Simone, Ender, Johannes, de, O., Roberto, L., Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Temperature Increase in MRAM at Writing: A Finite Element Approach";
  Talk: In 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) unknown, unknown.
  
  
• [CP-46] Weinbub, Josef, Ballicchia, Mauro, Etl, Clemens, Nedjalkov, Mihail:
  "Wigner Signed Particles for Electron Quantum Optics";
  Talk: In Mini Workshop "QuantMOCOTE - Modelling, Optimization and Control of Quantum systems in Technology and Education" Würzburg, DE.
  
  
• [CP-45] Sverdlov, Viktor, El-Sayed, Al-Moatasem, B., Seiler, Heribert, Kosina, Hans:
  "Edge States Dispersion in Narrow Nanoribbons of 2D Transition Metal Dichalcogenides in the 1T′ Topological Phase";
  Poster: In 22nd International Winterschool - New Developments in Solid State Physics - Abstract Book (pp. 116–116), Mauterndorf, AT.
  
  
• [CP-44] Bendra, Mario, Fiorentini, Simone, Hadamek, Tomas, Jorstad, Nils, P., Ender, Johannes, Lacerda, d. O., Roberto, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Switching Composite Free Layers in Ultra-Scaled MRAM Cells";
  Poster: In 22nd International Winterschool - New Developments in Solid State Physics - Abstract Book (pp. 184–185), Mauterndorf, AT.
  
  
• [CP-43] Bendra, Mario, Loch, Wilton, J., Jorstad, Nils, P., Fiorentini, Simone, Selberherr, Siegfried, Gös, Wolfgang, Sverdlov, Viktor:
  "Modeling Ultra-Scaled Multi-Layer STT-MRAM Cells: A Unified Spin and Charge Drift-Diffusion Approach";
  Talk: In Special MRAM poster session IEDM (pp. 18–19), San Francisco, CA, US.
  
  
• [CP-42] Sverdlov, Viktor, Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Lacerda, d. O., Roberto, Hadamek, Tomas, Loch, Wilton, J., Jorstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried:
  "Advanced Modeling of Emerging Devices for Digital Spintronics";
  Talk: In 2nd International Conference on Nanoscience and Nanotechnology (pp. 40–40), Dubai, AE.
  
  
• [CP-41] Fiorentini, Simone, Loch, Wilton, J., Bendra, Mario, Jørstad, Nils, P., Ender, Johannes, Orio, Roberto, Hadámek, Tomás, Goes, Wolfgang, Sverdlov, Viktor, Selberherr, Siegfried:
  "Design Analysis of Ultra-Scaled MRAM Cells";
  Talk: In Proceedings of 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Nanjing, China, CN.
  
  
• [CP-40] Kosina, Hans:
  "Numerische Modellierung der Beweglichkeit in verspanntem Silizium";
  Talk: In CiS MEMS Workshop Erfurt, DE.
  
  
• [CP-39] Filipovic, Lado:
  "Reliability of Platinum Microheater Geometries for MEMS-Based Gas Sensors";
  Talk: In 2022 IEEE International Integrated Reliability Workshop (IIRW) (pp. 1–6), South Lake Tahoe, CA, US.
  
  
• [CP-38] Reiter, Tobias, Klemenschits, Xaver, Filipovic, Lado:
  "Modeling Plasma-Induced Damage During the Dry Etching of Silicon";
  Poster: In 2022 IEEE International Integrated Reliability Workshop (IIRW) (pp. 1–5), South Lake Tahoe, CA, US.
  
  
• [CP-37] Fiorentini, Simone, Bendra, Mario, Ender, Johannes, Hadamek, Tomas, Loch, Wilton, J., Jorstad, Nils, P., Lacerda, d. O., Roberto, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Modeling Advanced Spintronic Based Magnetoresistive Memory";
  Talk: In International Conference on Microwave & THz Technologies, Wireless Communications and OptoElectronics (IRPhE 2022) (pp. 49–52), Yerevan, AM.
  
  
• [CP-36] Sverdlov, Viktor, Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Orio, Roberto, Hadámek, Tomás, Loch, Wilton, J., Jørstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried:
  "Modeling Advanced Spintronic Based Magnetoresistive Memory";
  Talk: In International Conference on Microwave & THz Technologies, Wireless Communications and OptoElectronics (IRPhE 2022) Yerevan, Armenia, AM.
  
  
• [CP-35] Fiorentini, Simone, Bendra, Mario, Ender, Johannes, Orio, Roberto, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Spin Torques in ULTRA-Scaled MRAM Devices";
  Talk: In Proceedings of the European Solid-State Device Research Conference (ESSDERC) (pp. 348–351), Milan, IT.
  
  
• [CP-34] Nazzari, Daniele, Genser, Jakob, A., Ritter, Viktoria, Bethge, Ole, Bertagnolli, Emmerich, Grasser, Tibor, Weber, Walter, M., Lugstein, Alois:
  "Epitaxial growth of crystalline CaF2 on silicene by molecular beam epitaxy";
  Talk: In European Material Research Society (E-MRS) Fall Meeting 2022 Warsaw, PL.
  
  
• [CP-33] Nazzari, Daniele, Genser, Jakob, A., Ritter, Viktoria, Bethge, Ole, Bertagnolli, Emmerich, Grasser, Tibor, Weber, Walter, M., Lugstein, Alois:
  "Epitaxial growth of crystalline CaF2 on silicene by molecular beam epitaxy";
  Talk: In 19th Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST-19) Mondsee, AT.
  
  
• [CP-32] Hadámek, Tomás, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Modeling Thermal Effects in STT-MRAM";
  Poster: In SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet (pp. 132–133), Granada, ES.
  
  
• [CP-31] Filipovic, Lado:
  "A Broadly-Applicable Ensemble Monte Carlo Framework";
  Talk: In Workshop Monte Carlo Simulation: Beyond Moore's Law, 2022 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Granada, ES.
  
  
• [CP-30] Wilhelmer, Christoph, Waldhör, Dominic, Jech, Markus, El-Sayed, Al-Moatasem, Cvitkovich, Lukas, Waltl, Michael, Grasser, Tibor:
  "Ab-Initio Study of Multi-State Defects in Amorphous SiO2";
  Talk: In PSI-K 2022: abstracts book Lausanne, CH.
  
  
• [CP-29] Cvitkovich, Lukas, Waldhör, Dominic, El-Sayed, Al-Moatasem, Jech, Markus, Wilhelmer, Christoph, Grasser, Tibor:
  "Ab-Initio Modeling of the Initial Stages of Si(100) Thermal Oxidation";
  Poster: In PSI-K 2022: abstracts book Lausanne, CH.
  
  
• [CP-28] Sverdlov, Viktor, Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Lacerda, d. O., Roberto, Hadamek, Tomas, Loch, Wilton, J., Jorstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried:
  "Advanced Modeling of Emerging Magneto-resistive Memory";
  Talk: In NANOMEET 2022 2nd International Meet & Expo on Nanotechnology (pp. 78–79), Edinburgh, GB.
  
  
• [CP-27] Ceric, Hajdin, Lacerda, d. O., Roberto, Selberherr, Siegfried:
  "Statistical Study of Electromigration in Gold Interconnects";
  Talk: In 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (pp. 1–5), Singapore, SG.
  
  
• [CP-26] Kosina, Hans:
  "Particle Models for Electron-Electron Scattering";
  Talk: In Book of Abstracts Quantum Transport Methods and Algorithms: From Particles to Waves Approaches (pp. 10–10), Zurich, CH.
  
  
• [CP-25] Sverdlov, Viktor, Loch, Wilton, J., Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Orio, Roberto, Hadámek, Tomás, Jorstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried:
  "Modeling Approach to Ultra-Scaled MRAM Cells";
  Talk: In Book of Abstracts of the International Meet On Applied Science, Engineering and Technology (ASETMEET) (pp. 7–8), Taastrup, Copenhagen, DK.
  
  
• [CP-24] Hadámek, Tomás, Fiorentini, Simone, Bendra, Mario, Orio, Roberto, Loch, Wilton, J., Jorstad, Nils, P., Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Temperature Modeling in STT-MRAM:A Fully Three-Dimensional Finite Element Approach";
  Talk: In Book of Abstracts of the International Conference on Nanostructured Materials (NANO) Sevilla, ES.
  
  
• [CP-23] Jørstad, Nils, P., Fiorentini, Simone, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Modeling Interfacial and Bulk Spin-Orbit torques";
  Talk: In Book of Abstracts of the International Conference on Nanostructured Materials (NANO) Sevilla, ES.
  
  
• [CP-22] Loch, Wilton, J., Selberherr, Siegfried, Sverdlov, Viktor:
  "Simulation of Novel MRAM Devices with Enhanced Performance";
  Talk: In Book of Abstracts of the International Conference on Nanostructured Materials (NANO) Sevilla, ES.
  
  
• [CP-21] Sverdlov, Viktor, Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Orio, Roberto, Hadámek, Tomás, Loch, Wilton, J., Jørstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried:
  "Emerging Devices for Digital Spintronics";
  Talk: In 2nd Global Conference & Expo on Nanotechnology & Nanoscience (pp. 32–33), online, unknown.
  
  
• [CP-20] Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Orio, Roberto, Hadámek, Tomás, Loch, Wilton, J., Jørstad, Nils, P., Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Spin Transfer Torques in Ultra-Scaled MRAM Cells";
  Talk: In 2022 45th Jubilee International Convention on Information, Communication and Electronic Technology (MIPRO) (pp. 129–132), Opatija, HR.
  
  
• [CP-19] Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Orio, Roberto, Hadámek, Tomás, Loch, Wilton, J., Jørstad, Nils, P., Goes, Wolfgang, Selberherr, Siegfried:
  "Interface Effects in Ultra-Scaled MRAM Cells";
  Talk: In Letters from the 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) 2022 Udine, IT.
  
  
• [CP-18] Jorstad, Nils, P., Fiorentini, Simone, Ender, Johannes, Lacerda, d. O., Roberto, Hadamek, Tomas, Loch, Wilton, J., Bendra, Mario, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Finite Element Modeling of Spin-Orbit Torques";
  Poster: In Proceedings of the Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS 2022)) (pp. 1–2), Udine, IT.
  
  
• [CP-17] Giparakis, Miriam, Knötig, Hedwig, M., Detz, Hermann, Beiser, Maximilian, Schrenk, Werner, Schwarz, Benedikt, Strasser, Gottfried, Andrews, Aaron, M.:
  "Top-Side Illuminated InAs/AlAsSb Quantum Cascade Detector at 2.7 µm";
  Talk: In CLEO: Science and Innovations 2022 San Jose, US.
  
  
• [CP-16] Sverdlov, Viktor, Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Orio, Roberto, Hadámek, Tomás, Loch, Wilton, J., Jørstad, Nils, P., Selberherr, Siegfried:
  "Modeling Advanced Magnetoresistive Memory: A Journey from Finite Element Methods to Machine Learning Approaches";
  Talk: In 2nd Global Webinar on Nanoscience & Nanotechnology online, unknown.
  
  
• [CP-15] Jørstad, Nils, P., Fiorentini, Simone, Goes, Wolfgang, Sverdlov, Viktor:
  "Efficient Finite Element Method Approach to Model Spin Orbit Torque MRAM";
  Talk: In Proceedings of the 14th International MOS-AK Workshop Silicon Valley, USA, US.
  
  
• [CP-14] Michl, J., Grill, Alexander, Stampfer, B., Waldhoer, D., Schleich, Christian, Knobloch, T., Ioannidis, E., Enichlmair, H., Minixhofer, R., Kaczer, B., Parvais, B., Govoreanu, Bogdan, Radu, I., Grasser, T., Waltl, M.:
  "Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS";
  Talk: In Proceedings of the IEEE International Electron Devices Meeting (IEDM) (pp. 31.3.1–31.3.4), San Francisco, CA, US.
  
  
• [CP-13] Fiorentini, Simone, Bendra, Mario, Ender, Johannes, Orio, Roberto, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Design Support for Ultra-Scaled MRAM Cells";
  Poster: In 2021 IEEE International Electron Devices Meeting (IEDM) San Francisco, US.
  
  
• [CP-12] Ender, Johannes, Fiorentini, Simone, Orio, Roberto, Hadámek, Tomás, Bendra, Mario, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Advances in Modeling Emerging Magnetoresistive Random Access Memories: From Finite Element Methods to Machine Learning Approaches";
  Talk: In Proc. SPIE 12157, International Conference on Micro- and Nano-Electronics 2021 Zvenigorod, RU.
  
  
• [CP-11] Ender, Johannes, Fiorentini, Simone, Orio, Roberto, Hadámek, Tomás, Bendra, Mario, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Advanced Modeling of Emerging MRAM: From Finite Element Methods to Machine Learning Approaches";
  Talk: In Proceedings of the International Conference Micro- and Nanoelectronics (ICMNE) Moscow-Zvenigorod, RU.
  
  
• [CP-10] Bendra, Mario, Ender, Johannes, Fiorentini, Simone, Hadámek, Tomás, Orio, Roberto, Goes, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Finite Element Method Approach to MRAM Modeling";
  Talk: In 2021 44th International Convention on Information, Communication and Electronic Technology (MIPRO) Opatija, Croatia, EU.
  
  
• [CP-9] Wilhelmer, Christoph, Jech, Markus, Waldhoer, Dominic, El-Sayed, Al-Moatasem, B., Cvitkovich, Lukas, Grasser, Tibor:
  "Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO₂ Network";
  Talk: In ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Grenoble, FR.
  
  
• [CP-8] Cvitkovich, Lukas, Jech, Markus, Waldhör, Dominic, El-Sayed, Al-Moatasem, Wilhelmer, Christoph, Grasser, Tibor:
  "Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface";
  Talk: In ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Grenoble, FR.
  
  
• [CP-7] Hadámek, Tomás, Bendra, Mario, Fiorentini, Simone, Ender, Johannes, Orio, Roberto, Gös, Wolfgang, Selberherr, Siegfried, Sverdlov, Viktor:
  "Temperature increase in STT-MRAM at writing: A fully three-dimensional finite element approach";
  Talk: In 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS'2021) Caen, FR.
  
  
• [CP-6] Fiorentini, Simone, Ender, Johannes, Mohamedou, Mohamed, Orio, Roberto, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Computation of Torques in Magnetic Tunnel Junctions through Spin and Charge Transport Modeling";
  Talk: In 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Tokyo, JP.
  
  
• [CP-5] Ender, Johannes, Mohamedou, Mohamed, Fiorentini, Simone, Orio, Roberto, Selberherr, Siegfried, Goes, Wolfgang, Sverdlov, Viktor:
  "Efficient Demagnetizing Field Calculation for Disconnected Complex Geometries in STT-MRAM Cells";
  Talk: In 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Tokyo, JP.
  
  
• [CP-4] Fiorentini, Simone, Ender, Johannes, Mohamedou, Mohamed, Selberherr, Siegfried, Orio, Roberto, Goes, Wolfgang, Sverdlov, Viktor:
  "Comprehensive Modeling of Coupled Spin-Charge Transport and Magnetization Dynamics in STT-MRAM Cells";
  Talk: In Spintronics XIII (pp. 50–56), unknown, AT.
  
  
• [CP-3] Tselios, K., Stampfer, B., Michl, J., Ioannidis, E., Enichlmair, H., Waltl, M.:
  "Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors";
  Talk: In 2020 IEEE International Integrated Reliability Workshop (IIRW) South Lake Tahoe, CA, USA, NON-EU.
  
  
• [CP-2] Vasilev, Alexander, Jech, Markus, Grill, Alexander, Rzepa, Gerhard, Schleich, Christian, Makarov, Alexander, Pobegen, Gregor, Grasser, Tibor, Waltl, Michael, Tyaginov, Stanislav:
  "Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors";
  Talk: In 2020 IEEE International Integrated Reliability Workshop (IIRW) South Lake Tahoe, CA, USA, NON-EU.
  
  
• [CP-1] Fiorentini, Simone, Ender, Johannes, Mohamedou, Mohamed, Sverdlov, Viktor, Goes, Wolfgang, Orio, Roberto, Selberherr, Siegfried:
  "Comprehensive modeling of coupled spin-charge transport and magnetization dynamics in STT-MRAM cells";
  Talk: In Spintronics XIII San Diego, CA, USA, NON-EU.
  
  

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No publications of this type.

No publications of this type.