Papers in Conference Proceedings
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- [V83] R. Entner, T. Grasser, H. Enichlmair, R. Minixhofer:
"Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress Temperatures"; Talk: Workshop on Dielectrics in Microelectronics (WODIM), Catania; 06-26-2006 - 06-28-2006; in: "WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts", (2006), 96 - 97.
- [V82] S. Holzer, A. Sheikholeslami, M. Karner, T. Grasser:
"Comparison of Deposition Models for TEOS CVD Process"; Talk: Workshop on Dielectrics in Microelectronics (WODIM), Catania; 06-26-2006 - 06-28-2006; in: "WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts", (2006), 158 - 159.
- [V81] M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Gös, M. Vasicek, T. Grasser, H. Kosina, S. Selberherr:
"VSP-A Gate Stack Analyzer"; Talk: Workshop on Dielectrics in Microelectronics (WODIM), Catania; 06-26-2006 - 06-28-2006; in: "WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts", (2006), 101 - 102.
- [V80] T. Grasser, S. Selberherr:
"Modeling of Negative Bias Temperature Instability"; Talk: Symposium Diagnostics & Yield: Advanced Silicon Devices and Technologies for ULSI ERA, Warszawa (invited); 06-25-2006 - 06-28-2006; in: "Abstracts 7th Symposium Diagnostics & Yield: Advanced Silicon Devices and Technologies for ULSI ERA", (2006), 1 - 2.
- [V79] R. Heinzl, M. Spevak, P Schwaha, T. Grasser:
"A High Performance Generic Scientific Simulation Environmemt"; Talk: Workshop on State-of-the-Art in Scientific and Parallel Computing (PARA), Umea; 06-18-2006 - 06-21-2006; in: "Proceedings of the PARA Conference", (2006), 61.
- [V78] P Schwaha, R. Heinzl, M. Spevak, T. Grasser:
"Advanced Equation Processing for TCAD"; Talk: Workshop on State-of-the-Art in Scientific and Parallel Computing (PARA), Umea; 06-18-2006 - 06-21-2006; in: "Proceedings of the PARA Conference", (2006), 64.
- [V77] M. Spevak, R. Heinzl, P Schwaha, T. Grasser:
"A Computational Framework for Topological Operations"; Talk: Workshop on State-of-the-Art in Scientific and Parallel Computing (PARA), Umea; 06-18-2006 - 06-21-2006; in: "Proceedings of the PARA Conference", (2006), 57.
- [V76] S. Dhar, E. Ungersböck, H. Kosina, T. Grasser, S. Selberherr:
"Electron Mobility Model for <110> Stressed Si Including Strain-Dependent Mass"; Poster: Silicon Nanoelectronics Workshop, Honolulu; 06-11-2006 - 06-12-2006; in: "Abstracts IEEE 2006 Silicon Nanoelectronics Workshop", (2006), 153 - 154.
- [V75] R. Entner, T. Grasser, H. Enichlmair, R. Minixhofer:
"Influence of Interface and Oxide Traps on Negative Bias Temperature Instability"; Poster: Silicon Nanoelectronics Workshop, Honolulu; 06-11-2006 - 06-12-2006; in: "Abstracts IEEE 2006 Silicon Nanoelectronics Workshop", (2006), 163 - 164.
- [V74] M. Karner, A. Gehring, S. Holzer, M. Wagner, H. Kosina:
"Continuum Versus Quasi-Bound State Tunneling in Novel Device Architectures"; Poster: Silicon Nanoelectronics Workshop, Honolulu; 06-11-2006 - 06-12-2006; in: "Abstracts IEEE 2006 Silicon Nanoelectronics Workshop", (2006), 161 - 162.
- [V73] V. Sverdlov, E. Ungersböck, H. Kosina, S. Selberherr:
"Comparative Study of Low-Field Mobilities in Double- and Single-Gate Ultra-Thin Body SOI for Different Substrate Orientations"; Talk: Silicon Nanoelectronics Workshop, Honolulu; 06-11-2006 - 06-12-2006; in: "Abstracts IEEE 2006 Silicon Nanoelectronics Workshop", (2006), 17 - 18.
- [V72] G. Ferrari, C. Jacoboni, M. Nedjalkov, A. Asenov:
"Introducing Energy Broadening in Semiclassical Monte Carlo Simulations"; Talk: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 17 - 18.
- [V71] M. Karner, A. Gehring, S. Holzer, M. Pourfath, M. Wagner, H. Kosina, T. Grasser, S. Selberherr:
"VSP-A Multi-Purpose Schrödinger-Poisson Solver for TCAD Applications"; Poster: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 255 - 256.
- [V70] L. Li, G. Meller, H. Kosina:
"Percolation Current in Organic Semiconductors"; Poster: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 161 - 162.
- [V69] M. Nedjalkov, D. Vasileska, E. Atanassov, V. Palankovski:
"Ultrafast Wigner Transport in Quantum Wires"; Poster: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 285 - 286.
- [V68] M. Pourfath, H. Kosina, S. Selberherr:
"Dissipative Transport in CNTFETs"; Talk: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 345 - 346.
- [V67] M. Pourfath, H. Kosina, S. Selberherr:
"Tunneling CNTFETs"; Poster: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 291 - 292.
- [V66] V. Suvorov, A. Hössinger, Z. Djuric:
"A Novel Approach to Three-Dimensional Semiconductor Process Simulation: Application to Thermal Oxidation"; Talk: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 3-901578-16-1; 3 - 4.
- [V65] V. Sverdlov, T. Grasser, H. Kosina, S. Selberherr:
"Scattering and Space-Charge Effects in Wigner Monte Carlo Simulations of Single and Double Barrier Devices"; Talk: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 29 - 30.
- [V64] E. Ungersböck, S. Dhar, G. Karlowatz, H. Kosina, S. Selberherr:
"Physical Modeling of Electron Mobility Enhancement for Arbitrarily Strained Silicon"; Poster: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 141 - 142.
- [V63] M. Wagner, T. Grasser, M. Karner, H. Kosina:
"Quantum Correction for DG MOSFETs"; Poster: International Workshop on Computational Electronics (IWCE), Wien; 05-25-2006 - 05-27-2006; in: "11th International Workshop on Computational Electronics Book of Abstracts", (2006), ISBN: 0-9767985-8-1; 87 - 88.
- [V62] R. Heinzl, M. Spevak, P Schwaha, T. Grasser:
"High Performance Process and Device Simulation with a Generic Environment"; Talk: Iranian Conference on Electrical Engineering (ICEE), Tehran; 05-16-2006 - 05-18-2006; in: "Proceedings of the 14th Iranian Conference on Electrical Engineering ICEE 2006", (2006), 4 pages.
- [V61] M. Pourfath, H. Kosina, S. Selberherr:
"On the Effect of Scattering on the Performance of Carbon Nanotube Field-Effect Transistors"; Talk: Iranian Conference on Electrical Engineering (ICEE), Tehran; 05-16-2006 - 05-18-2006; in: "Proceedings of the 14th Iranian Conference on Electrical Engineering ICEE 2006", (2006), 5 pages.
- [V60] A. Sheikholeslami, R. Heinzl, S. Holzer, C. Heitzinger, M. Spevak, M. Leicht, O. Häberlen, J. Fugger, F. Badrieh, F. Parhami, H. Puchner, T. Grasser, S. Selberherr:
"Applications of Two- and Three-Dimensional General Topography Simulator in Semiconductor Manufacturing Processes"; Talk: Iranian Conference on Electrical Engineering (ICEE), Tehran; 05-16-2006 - 05-18-2006; in: "Proceedings of the 14th Iranian Conference on Electrical Engineering ICEE 2006", (2006), 4 pages.
- [V59] S. Dhar, H. Kosina, G. Karlowatz, E. Ungersböck, T. Grasser, S. Selberherr:
"A Tensorial High-Field Electron Mobility Model for Strained Silicon"; Poster: International SiGe Technology and Device Meeting (ISTDM), Princeton; 05-15-2006 - 05-17-2006; in: "2006 International SiGe Technology and Device Meeting Conference Digest", (2006), ISBN: 1-4244-0461-4; 72 - 73.
- [V58] M. Wagner, G. Span, T. Grasser:
"Thermoelectric Power Generation Using Large Area Si/SiGe pn-Junctions With Varying Ge-Content"; Talk: International SiGe Technology and Device Meeting (ISTDM), Princeton; 05-15-2006 - 05-17-2006; in: "2006 International SiGe Technology and Device Meeting Conference Digest", (2006), ISBN: 1-4244-0461-4; 216 - 217.
- [V57] S. Holzer, S. Selberherr:
"Optimization Issue in Interconnect Analysis"; Talk: International Conference on Microelectronics (MIEL), Beograd (invited); 05-14-2006 - 05-17-2006; in: "Proceedings International Conference on Microelectronics (MIEL)", (2006), ISBN: 1-4244-0116-X; 465 - 470.
- [V56] R. Heinzl, M. Spevak, P Schwaha, T. Grasser:
"A Generic Scientific Simulation Environment for Multidimensional Simulation in the Area of TCAD"; Talk: The Nanotechnology Conference and Trade Show, Boston; 05-07-2006 - 05-11-2006; in: "NSTI Nanotech Proceedings", (2006), ISBN: 0-9767985-8-1; 526 - 529.
- [V55] R. Heinzl, M. Spevak, P Schwaha:
"A Novel High Performance Approach for Technology Computer Aided Design"; Talk: Student Electrical Engineering, Information and Communication Technologies (STUDENT EEICT), Brünn; 04-27-2006; in: "Proceedings of the 12th Conference Student EEICT 2006", Vol.4 (2006), ISBN: 80-214-3163-6; 446 - 450.
- [V54] R. Heinzl, M. Spevak, P Schwaha, T. Grasser:
"Multidimensional and Multitopological TCAD with a Generic Scientific Simulation Environment"; Talk: International Caracas Conference on Devices, Circuits and Systems (ICCDCS), Playa del Carmen; 04-26-2006 - 04-28-2006; in: "Proceedings International Caribbean Conference on Devices, Circuits and Systems", (2006), ISBN: 1-4244-0042-2; 173 - 176.
- [V53] P Schwaha, R. Heinzl, W. Brezna, J. Smoliner, H. Enichlmair, R. Minixhofer, T. Grasser:
"Leakage Current Analysis of a Real World Silicon-Silicon Dioxide Capacitance"; Talk: International Caracas Conference on Devices, Circuits and Systems (ICCDCS), Playa del Carmen; 04-26-2006 - 04-28-2006; in: "Proceedings International Caribbean Conference on Devices, Circuits and Systems", (2006), ISBN: 1-4244-0042-2; 365 - 370.
- [V52] V. Sverdlov, H. Kosina, S. Selberherr:
"Current Flow in Upcoming Microelectronic Devices"; Talk: International Caracas Conference on Devices, Circuits and Systems (ICCDCS), Playa del Carmen (invited); 04-26-2006 - 04-28-2006; in: "Proceedings International Caribbean Conference on Devices, Circuits and Systems", (2006), ISBN: 1-4244-0041-4; 3 - 8.
- [V51] R. Entner, T. Grasser:
"Investigation of NBTI Recovery During Measurement"; Talk: Materials Research Society Spring Meeting (MRS), San Francisco; 04-17-2006 - 04-21-2006; in: "San Francisco 2006 MRS Meeting Abstracts", (2006), 110 - 111.
- [V50] M. Karner, M. Wagner, T. Grasser, H. Kosina:
"A Physically Based Quantum Correction Model for DG MOSFETs"; Talk: Materials Research Society Spring Meeting (MRS), San Francisco; 04-17-2006 - 04-21-2006; in: "San Francisco 2006 MRS Meeting Abstracts", (2006), 104 - 105.
- [V49] M. Spevak, R. Heinzl, P Schwaha, T. Grasser:
"Process and Device Simulation With a Generic Scientific Simulation Environment"; Talk: International Conference on Microelectronics (MIEL), Beograd; 04-14-2006 - 04-17-2006; in: "Proceedings International Conference on Microelectronics (MIEL)", (2006), ISBN: 1-4244-0116-X; 475 - 478.
- [V48] V. Sverdlov, E. Ungersböck, H. Kosina:
"Mobility for High Effective Field in Double-Gate and Single-Gate SOI for Different Substrate Orientations"; Talk: Workshop of the Thematic Network on Silicon on Insulator Technology, Devices, and Circuits (EUROSOI), Grenoble; 03-08-2006 - 03-10-2006; in: "EUROSOI 2006 Second Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits", (2006), 133 - 134.
- [V47] S. Selberherr:
"Methodologies and Scientific Issues for the Modeling of Advanced Semiconductor Devices"; Talk: Workshop on Semiconductors and Micro- & Nano-Technology (SEMINATEC), Campinas; 02-09-2006 - 02-10-2006; in: "Abstracts of Workshop on Semiconductors and Micro- & Nano-Technology", (2006), 12 - 15.
- [V46] R. Heinzl, P Schwaha, M. Spevak, T. Grasser:
"Concepts for High Performance Generic Scientific Computing"; Talk: International Symposium on Mathematical Modeling (MATHMOD), Wien; 02-08-2006 - 02-10-2006; in: "5th Mathmod Vienna Proceedings", (2006), ISBN: 3-901608-30-3; 4-1 - 4-9.
- [V45] G. Karlowatz, W. Wessner, H. Kosina:
"Effect of Band Structure Discretization on the Performance of Full-Band Monte Carlo Simulation"; Talk: International Symposium on Mathematical Modeling (MATHMOD), Wien; 02-08-2006 - 02-10-2006; in: "5th Mathmod Vienna Proceedings", (2006), ISBN: 3-901608-30-3; 4-1 - 4-6.
- [V44] M. Spevak, R. Heinzl, P Schwaha:
"Simulation of Microelectronic Structures Using A Posteriori Error Estimation and Mesh Optimization"; Talk: International Symposium on Mathematical Modeling (MATHMOD), Wien; 02-08-2006 - 02-10-2006; in: "5th Mathmod Vienna Proceedings", (2006), ISBN: 3-901608-30-3;; 317.
- [V43] V. Sverdlov, H. Kosina, S. Selberherr:
"Current Transport in Nanoelectronic Semiconductor Devices"; Talk: IEEE Conference on Emerging Technologies - Nanoelectronics (NanoSingapore), Singapore (invited); 01-10-2006 - 01-13-2006; in: "Proceedings IEEE Conference on Emerging Technologies - Nanoelectronics", (2006), ISBN: 0-7803-9358-9; 490 - 495.
- [V42] L. Li, H. Kosina:
"An Analytical Model for Organic Thin Film Transistors"; Talk: Conference on Electron Devices and Solid-State Circuits (EDSSC), Hong Kong; 12-19-2005 - 12-21-2005; in: "Proceedingd of the 2005 IEEE Conference on Electron Devices and Solid-State Circuits", (2005), ISBN: 0-7803-9339-2; 571 - 574.
- [V41] G. Meller, L. Li, H. Kosina:
"Kinetic Monte Carlo Simulation of Molecularly Doped Organic Semiconductors"; Poster: Meeting on Molecular Electronics (ELECMOL), Grenoble; 12-19-2005 - 12-21-2005; in: "Second Meeting on Molecular Electronics", (2005), 107.
- [V40] V. Sverdlov, H. Kosina, S. Selberherr:
"Modeling Current Transport in Ultra-Scaled Field Effect Transistors"; Talk: Conference on Electron Devices and Solid-State Circuits (EDSSC), Hong Kong (invited); 12-19-2005 - 12-21-2005; in: "Proceedings of the 2005 IEEE Conference on Electron Devices and Solid-State Circuits", (2005), ISBN: 0-7803-9339-2; 385 - 390.
- [V39] S. Dhar, G. Karlowatz, E. Ungersböck, H. Kosina, S. Selberherr:
"Modeling of Velocity-Field Characteristics in Strained Silicon"; Poster: International Workshop on the Physics of Semiconductor Devices (IWPSD), New Dehli; 12-13-2005 - 12-17-2005; in: "Proceedings of the XIII International Workshop on Physics of Semiconductor Devices", Vol. 2 (2005), ISBN: 81-7764-947-7; 1060 - 1063.
- [V38] S. Holzer, S. Selberherr:
"Material Parameter Identification for Interconnect Analysis"; Talk: International Workshop on the Physics of Semiconductor Devices (IWPSD), New Dehli (invited); 12-13-2005 - 12-17-2005; in: "Proceedings of the XIII International Workshop on Physics of Semiconductor Devices", Vol. 2 (2005), ISBN: 81-7764-946-9; 635 - 641.
- [V37] M. Wagner, M. Karner, T. Grasser:
"Quantum Correction Models for Modern Semiconductor Devices"; Poster: International Workshop on the Physics of Semiconductor Devices (IWPSD), New Dehli; 12-13-2005 - 12-17-2005; in: "Proceedings of the XIII International Workshop on Semiconductor Devices", Vol. 1 (2005), 458 - 461.
- [V36] M. Pourfath, H. Kosina, S. Selberherr:
"Rigorous Modeling of Carbon Nanotube Field Effect Transistors"; Poster: International Conference on New Phenomena in Mesoscopic Structures, Maui; 11-27-2005 - 12-02-2005; in: "Abstracts Collection Seventh International Conference on New Phenomena in Mesoscopic Systems Fifth International Conference on Surface and Interfaces in Mesoscopic Devices", (2005), 155 - 156.
- [V35] R. Heinzl, P Schwaha, M. Spevak, T. Grasser:
"Adaptive Mesh Generation for TCAD with Guaranteed Error Bounds"; Talk: European Simulation and Modeling Conference (ESMC), Porto; 10-26-2005 - 10-28-2005; in: "The 2005 European Simulation and Modelling Conference Proceedings", (2005), 425 - 429.
- [V34] E. Al-Ani, R. Heinzl, P Schwaha, T. Grasser, S. Selberherr:
"Three-Dimensional State-Of-The-Art Topography Simulation"; Talk: European Simulation and Modeling Conference (ESMC), Porto; 10-24-2005 - 10-26-2005; in: "The 2005 European Simulation and Modelling Conference Proceedings", (2005), 430 - 432.
- [V33] A. Nentschev, R. Sabelka, W. Wessner, S. Selberherr:
"On Chip Interconnect Simulation of Parasitic Capacitances in Periodic Structures"; Talk: European Simulation and Modeling Conference (ESMC), Porto; 10-24-2005 - 10-26-2005; in: "The 2005 European Simulation and Modelling Conference Proceedings", (2005), 420 - 424.
- [V32] P Schwaha, R. Heinzl, W. Brezna, J. Smoliner, H. Enichlmair, R. Minixhofer, T. Grasser:
"Fully Three-Dimensional Analysis of Leakage Current in Non-Planar Oxides"; Talk: European Simulation and Modeling Conference (ESMC), Porto; 10-24-2005 - 10-26-2005; in: "The 2005 European Simulation and Modelling Conference Proceedings", (2005), 469 - 473.
- [V31] M. Spevak, T. Grasser:
"Discretisation Schemes For Macroscopic Transport Equations on Non-Cartesian Coordinate Systems"; Talk: European Simulation and Modeling Conference (ESMC), Porto; 10-24-2005 - 10-26-2005; in: "The 2005 European Simulation and Modelling Conference Proceedings", (2005), 474 - 478.
- [V30] R. Wittmann, H. Puchner, L. Hinh, H. Ceric, A. Gehring, S. Selberherr:
"Impact of NBTI-driven Parameter Degradation on Lifetime of a 90nm p-MOSFET"; Poster: IEEE International Reliability Workshop (IIRW), S. Lake Tahoe; 10-17-2005 - 10-20-2005; in: "2005 IEEE International Integrated Reliability Workshop Final Report", (2005), ISBN: 0-7803-8992-1; 99 - 102.
- [V29] Ch. Hollauer, H. Ceric, S. Selberherr:
"Three-Dimensional Simulation of Thermal Oxidation and the Influence of Stress"; Talk: Meeting of the Electrochemical Society (ECS), Los Angeles; 10-16-2005 - 10-21-2005; in: "208th Meeting of the Electrochemical Society", (2005), ISSN: 1091-8213; Paper ID 734, 1 pages.
- [V28] M. Karner, A. Gehring, S. Holzer, H. Kosina, S. Selberherr:
"Efficient Calculation of Quasi-Bound State Tunneling through Stacked Dielectrics"; Talk: Meeting of the Electrochemical Society (ECS), Los Angeles; 10-16-2005 - 10-21-2005; in: "208th Meeting of the Electrochemical Society", (2005), ISSN: 1091-8213.
- [V27] A. Nentschev, R. Sabelka, S. Selberherr:
"Simplification of Spacial Structures by Simulation with Periodic Boundary Conditions"; Talk: VLSI Multilevel Interconnection Conference (VMIC), Fremont; 10-03-2005 - 10-06-2005; in: "2005 Proceedings Twenty Second International VLSI Multilevel Interconnection Conference", (2005), 547 - 552.
- [V26] L. Li, G. Meller, H. Kosina:
"Temperature and Field-dependence of Hopping Conduction in Organic Semiconductors"; Poster: European Conference on Organic Electronics and Related Phenomena (ECOER), Winterthur; 09-27-2005 - 09-30-2005; in: "3rd European Conference on Organic Electronics and Related Phenomena Book of Abstracts", (2005), 112 - 113.
- [V25] G. Meller, L. Li, H. Kosina:
"Monte Carlo Simulation of Molecularly Doped Organic Semiconductors"; Talk: European Conference on Organic Electronics and Related Phenomena (ECOER), Winterthur; 09-27-2005 - 09-30-2005; in: "3rd European Conference on Organic Electronics and Related Phenomena Book of Abstracts", (2005), 44 - 45.
- [V24] H. Ceric, Ch. Hollauer, S. Selberherr:
"Microstructure and Stress Aspects of Electromigration Modeling"; Poster: International Workshop on Stress-Induced Phenomena in Metallization, Dresden; 09-12-2005 - 09-14-2005; in: "8th International Workshop on Stress-Induced Phenomena in Metallization", (2005), P 17.
- [V23] M. Pourfath, H. Kosina, B.-H. Cheong, J.M. Park, S. Selberherr:
"Improving DC and AC Characteristics of Ohmic Contact Carbon Nanotube Field Effect Transistors"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble; 09-12-2005 - 09-16-2005; in: "Proceedings of ESSDERC 2005", CDROM ISBN: 0-7803-9204-3 (2005), 0-7803-9203-5; 541 - 544.
- [V22] V. Sverdlov, A. Gehring, H. Kosina, S. Selberherr:
"Tunneling and Intersubband Coupling in Ultra-Thin Body Double-Gate MOSFETs"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble; 09-12-2005 - 09-16-2005; in: "Proceedings of ESSDERC 2005", CDROM ISBN: 0-7803-9204-3 (2005), ISBN: 0-7803-9203-5; 93 - 96.
- [V21] S. Dhar, G. Karlowatz, E. Ungersböck, H. Kosina:
"Numerical and Analytical Modeling of the High-Field Electron Mobility in Strained Silicon"; Poster: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 223 - 226.
- [V20] R. Entner, A. Gehring, H. Kosina, T. Grasser, S. Selberherr:
"Modeling of Tunneling Currents for Highly Degraded CMOS Devices"; Poster: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 219 - 222.
- [V19] R. Heinzl, T. Grasser:
"Generalized Comprehensive Approach for Robust Three-Dimensional Mesh Generation for TCAD"; Poster: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 211 - 214.
- [V18] Ch. Hollauer, H. Ceric, S. Selberherr:
"Three-Dimensional Simulation of Stress Dependent Thermal Oxidation"; Poster: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 183 - 186.
- [V17] M. Karner, A. Gehring, H. Kosina, S. Selberherr:
"Efficient Calculation of Quasi-Bound State Tunneling in CMOS Devices"; Talk: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 35 - 38.
- [V16] M. Pourfath, H. Kosina, B.-H. Cheong, J.M. Park:
"Geometry-dependence of the DC and AC Response of Ohmic Contact Carbon Nanotube Field Effect Transistor"; Talk: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 91 - 94.
- [V15] P Schwaha, R. Heinzl, M. Spevak, T. Grasser:
"Coupling Three-Dimensional Mesh Adaptation with an A Posteriori Error Estimator"; Poster: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 235 - 238.
- [V14] A. Sheikholeslami, F. Parhami, R. Heinzl, E. Al-Ani, C. Heitzinger, F. Badrieh, H. Puchner, T. Grasser, S. Selberherr:
"Applications of Three-Dimensional Topography Simulation in the Design of Interconnect Lines"; Poster: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 187 - 190.
- [V13] G. Span, M. Wagner, T. Grasser:
"Thermoelectric Power Generation Using Large Area pn-Junctions"; Talk: European Conference on Thermoelectrics (ECT), Nancy; 09-01-2005 - 09-02-2005; in: "The 3rd European Conference on Thermoelectrics Proceedings ECT2005", (2005), 72 - 75.
- [V12] E. Ungersböck, H. Kosina:
"The Effect of Degeneracy on Electron Transport in Strained Silicon Inversion Layers"; Talk: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 311 - 314.
- [V11] W. Wessner, H. Ceric, J. Cervenka, S. Selberherr:
"Dynamic Mesh Adaptation for Three-Dimensional Elektromigration Simulation"; Talk: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 147 - 150.
- [V10] R. Wittmann, A. Hössinger, S. Selberherr:
"Monte Carlo Simulation of Ion Implatation for Doping of Strained Silicon MOSFETs"; Poster: International Conference on the Simulation of Semiconductor Processes and Devices (SISPAD), Tokyo; 09-01-2005 - 09-03-2005; in: "International Conference on Simulation of Semiconductor Processes and Devices 2005", (2005), ISBN: 4-9902762-0-5; 191 - 194.
- [V9] R. Heinzl, M. Spevak, P Schwaha, T. Grasser:
"A Novel Technique for Coupling Three Dimensional Mesh Adaption With An A Posteriori Error Estimator"; Talk: PhD Research in Microelectronics and Electronics (PRIME), Lausanne; 07-25-2005 - 07-28-2005; in: "2005 PhD Research in Microelectronics and Electronics", Vol. 1 (2005), 0-7803-9345-7; 175 - 178.
- [V8] A. Sheikholeslami, S. Holzer, C. Heitzinger, M. Leicht, O. Häberlen, J. Fugger, T. Grasser, S. Selberherr:
"Inverse Modeling of Oxid Deposition Using Measurements of a TEOS CVD Process"; Talk: PhD Research in Microelectronics and Electronics (PRIME), Lausanne; 07-25-2005 - 07-28-2005; in: "2005 PhD Research in Microelectronics and Electronics", Vol. 2 (2005), ISBN: 0-7803-9345-7; 279 - 282.
- [V7] M. Pourfath, H. Kosina, B.-H. Cheong, J.M. Park, S. Selberherr:
"The Effect of Device Geometry on the Static and Dynamic Response of Carbon Nanotube Field Effect Transistors"; Talk: IEEE Conference on Nanotechnology (IEEE-NANO), Nagoya; 07-11-2005 - 07-15-2005; in: "Proceedings of IEEE-NANO 2005", CDROM ISBN: 0-7803-9200-0 (2005), 4 pages.
- [V6] A. Gehring, S. Selberherr:
"Current Transport Models for Nano-Scale Semiconductor Devices"; Talk: World Multiconference on Systemics, Cybernetics and Informatics (SCI), Orlando (invited); 07-10-2005 - 07-13-2005; in: "Proc. 9th World Multi-Conf.on Systemics, Cybernetics and Informatics", Vol. 6 (2005), ISBN: 980-6560-58-2; 366 - 371.
- [V5] M. Karner, A. Gehring, H. Kosina:
"Efficient Calculation of Life Time Based Direct Tunneling through Stacked Dielectrics"; Talk: Modelling and Simulation of Electron Devices (MSED), Pisa; 07-04-2005 - 07-05-2005; in: "15th Workshop on Modelling and Simulation of Electron Devices", (2005), 97 - 98.
- [V4] M. Pourfath, H. Kosina, S. Selberherr:
"A Fast and Stable Poisson-Schrödinger Solver for the Analysis of Carbon Nanotube Transistors"; Talk: Modelling and Simulation of Electron Devices (MSED), Pisa; 07-04-2005 - 07-05-2005; in: "15th Workshop on Modelling and Simulation of Electron Devices", (2005), 95 - 96.
- [V3] E. Ungersböck, H. Kosina:
"Monte Carlo Study of Electron Transport in Strained Silicon Inversion Layers"; Talk: Modelling and Simulation of Electron Devices (MSED), Pisa; 07-04-2005 - 07-05-2005; in: "15th Workshop on Modelling and Simulation of Electron Devices", (2005), 10 - 11.
- [V2] H. Ceric, V. Deshpande, Ch. Hollauer, S. Holzer, T. Grasser, S. Selberherr:
"Comprehensive Analysis of Vacancy Dynamics Due to Electromigration"; Talk: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 06-27-2005 - 07-01-2005; in: "Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2005), ISBN: 0-7803-9301-5; 100 - 103.
- [V1] T.V. Gurov, E. Atanasov, I. Dimov, V. Palankovski, S. Smirnov:
"Femtosecond Evolution of Spacially Inhomogeneous Carrier Excitations: Part II: Stochastic Approach and GRID Implementation"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol; 06-06-2005 - 06-10-2005; in: "5th International Conference on Large-Scale Scientific Computations", (2005), 26 - 27.
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Papers in Journals and Books |
- [P12] H. Ceric, R. Heinzl, Ch. Hollauer, T. Grasser, S. Selberherr:
"Microstructure and Stress Aspects of Electromigration Modeling"; in: "Stress-Induced Phenomena in Metallization", American Institute of Physics, Melville, 2006, ISBN: 0-7354-03104, 262 - 268.
- [P11] T.V. Gurov, E. Atanassov, I. Dimov, V. Palankovski:
"Femtosecond Evolution of Spatially Inhomogeneous Carrier Excitations Part II: Stochastic Approach and Grid Implementation"; in: "Lecture Notes in Computer Science Vol. 3743", Springer-Verlag, Berlin/Heidelberg, 2006, ISBN: 3-540-31994-8, 157 - 163.
- [P10] M. Karner, A. Gehring, S. Holzer, H. Kosina:
"Efficient Calculation of Quasi-bound States for the Simulation of Direct Tunneling"; in: "Lecture Notes in Computer Science Vol. 3743", Springer-Verlag, Berlin/Heidelberg, 2006, ISBN: 3-540-31994-8, 572 - 577.
- [P9] M. Nedjalkov, T.V. Gurov, H. Kosina, D. Vasileska, V. Palankovski:
"Femtosecond Evolution of Spatially Inhomogeneous Carrier Excitations Part I: Kinetic Approach"; in: "Lecture Notes in Computer Science Vol. 3743", Springer-Verlag, Berlin/Heidelberg, 2006, ISBN: 3-540-31994-8, 149 - 156.
- [P8] M. Pourfath, H. Kosina:
"Fast Convergent Schrödinger-Poisson Solver for the Static and Dynamic Analysis of Carbon Nanotube Field Effect Transistors"; in: "Lecture Notes in Computer Science Vol. 3743", Springer-Verlag, Berlin / Heidelberg, 2006, ISBN: 3-540-31994-8, 578 - 585.
- [P7] V. Sverdlov, H. Kosina, Ch. Ringhofer, M. Nedjalkov, S. Selberherr:
"Quantum Correction to the Semiclassical Electron-Phonon Scattering Operator"; in: "Lecture Notes in Computer Science Vol. 3743", Springer-Verlag, Berlin/Heidelberg, 2006, ISBN: 3-540-31994-8, 594 - 601.
- [P6] Ch. Hollauer, H. Ceric, S. Selberherr:
"Three-Dimensional Simulation of Thermal Oxidation and the Influence of Stress"; in: "Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5 Vol. 1 No. 1", issued by: H.Z. Massoud, J.H. Stathis, T. Hattori, D. Misra, I. Baumvol; ECS Transactions, Pennington, 2005, ISBN: 1-56677-430-6, 103 - 113.
- [P5] M. Nedjalkov:
"Wigner Transport in Presence of Phonons: Particle Models of the Electron Kinetics"; in: "From Nanostructures to Nanosensing Applications Volume 160", A. D´Amico, G. Balestrino, A. Paoletti (ed.); issued by: Societa Italiana Di Fisica; IOS Press, Amsterdam, 2005, (invited), ISBN: 1-58603-527-4, 55 - 103.
- [P4] V. Sverdlov, Y. Kinkhabwala, D. Kaplan, A.N. Korotkov, H. Kosina, S. Selberherr:
"Shot Noise Suppression and Enhancement at 2D Hopping and in Single-Electron Arrays"; in: "Unsolved Problems of Noise and Fluctuations", issued by: New York; American Institute of Physics, New York, 2005, ISBN: 0-7354-0289-2, 177 - 182.
- [P3] Y. Kinkhabwala, V. Sverdlov, A.N. Korotkov, K. Likharev:
"A Numerical Study of Transport and Shot Noise in 2D Hopping"; Journal of Physics: Condensed Matter, 18 (2006), 1999 - 2012.
- [P2] Y. Kinkhabwala, V. Sverdlov, K. Likharev:
"A Numerical Study of Coulomb Interaction Effects on 2D Hopping Transport"; Journal of Physics: Condensed Matter, 18 (2006), 2013 - 2027.
- [P1] M. Pourfath, H. Kosina, S. Selberherr:
"Rigorous Modeling of Carbon Nanotube Transistors"; IOP Journal of Physics: Conference Series, Vol. 38 (2006), 29 - 32.
- [E1] H. Kosina, S. Selberherr (ed.):
"11th International Workshop on Computational Electronics Book of Abstracts"; International Workshop on Computational Electronics (IWCE), Wien, 2006, ISBN: 3-901578-16-1; 400 pages.
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- [T2] M. Blaho:
"Experimental Characterisation of Smart Power Technology Devices Stressed by High Energy Pulses";
Reviewer: E. Gornik, E. Langer; Institut für Festkörperelektronik, 2006.
- [T1] R. Minixhofer
"Integrating Technology Simulation into the Semiconductor Manufacturing
Environment";
Reviewer: S. Selberherr, W. Pribyl; Institut für Festkörperelektronik, 2006.
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- [D1] L. Friembichler:
"Design and Implementation of a Generic Optimizer";
Supervisor: E. Langer, S. Holzer; Institut für Mikroelektronik, 2006.
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- [B5] K. Rupp:
"A-priori Estimations for FEM";
Institut für Mikroelektronik, 2006.
- [B4] F. Xaver:
"Fast Fourier Transformation";
Institut für Mikroelektronik, 2006.
- [B3] M. Jedenastik:
"2D Lösung der stationären Poissongleichung";
Institut für Mikroelektronik, 2006.
- [B2] M. Pongratz:
"Fehleroptimierung bei Positionsbestimmung durch Laufzeitmessung";
Institut für Mikroelektronik, 2006.
- [B1] S. Gashi:
"Capture Driven Triangulated Surface Simplification";
Institut für Mikroelektronik, 2005.
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