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- BiCMOS
- ,,Bipolar Complementary Metal Oxide Semiconductor``
- CED
- ,,Critical Damage-Energy-Density``
- CMOS
- ,,Complementary Metal Oxide Semiconductor``
- CPU
- ,,Central Processing Unit``
- CVD
- ,,Chemical Vapour Deposition``
- ECAD
- ,,Electronic Computer Aided
Design``
- IC
- ,,Integrated Circuit``
- JESSI
- ,,Joint European Sub-Micron
Silicon Initiative``
- LAT
- ,,Large-Angle-Tilt``
- LATID
- ,,Large-Angle-Tilt
Implanted Drain``
- LATIPS
- ,,Large-Angle-Tilt
Implanted Punch-Through Stopper``
- LDD
- ,,Lightly Doped Drain``
- LOCOS
- ,,Local Oxidation of Silicon``
- MCIMPL
- Monte Carlo Simulator für die Ionen
implantation
- MMS
- Massenmittelpunktsystem
- MOS
- ,,Metal Oxide Semiconductor``
- MOSFET
- ,,Metal Oxide Semiconductor
Field-Effect Transistor``
- NMOS
- ,,N-Channel Metal Oxide Semiconductor``
- PIF
- ,,Profile Interchange Format``
- PKA
- ,,Primary Knock-on Atom``
- PMOS
- ,,P-Channel Metal Oxide
Semiconductor``
- PROMPT
- ,,Process Optimization in Multi
ple Dimensions for Semiconductor Technology``
- RSCE
- ,,Reverse Short Channel Effect``
- RTA
- ,,Rapid Thermal Annealing``
- SIMS
- ,,Secondary Ion Mass Spectrometry``
- SRS
- ,,Split-Level Related Split``
- TCAD
- ,,Technology Computer Aided
Design``
- TEM
- ,,Transmission Electron Microscopy``
- TRS
- ,,Trajectory Related Split``
- ULSI
- ,,Ultra Large Scale Integration``
- X-TEM
- ,,Cross-section Transmission Electron Microscopy``
- VISTA
- ,,Viennese Integrated System
for Technology CAD Applications``
- ZKW
- Zweikörperwechselwirkung
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Mon Dec 23 13:09:21 MET 1996