R. A. Coppeta, H. Ceric, D. Holec, T. Grasser: “Critical thickness for
GaN thin film on AlN substrate”. IEEE International Integrated Reliability
Workshop (IIRW), Stanford Sierra Conference Center, South Lake Tahoe, CA,
USA; 2013-10-13 - 2013-10-17; in: “Proceedings of the International Integrated
Reliability Workshop 2013”, (2013), pp. 133-136.
[2]
R. A. Coppeta, H. Ceric, T. Grasser: “Epitaxial Volmer-Weber Growth
Modelling”. Talk at the International Conference on Simulation of
Semiconductor Processes and Devices (SISPAD); 2013-09-05 - 2013-09-05; in:
“Proceedings of the International Conference on Simulation of Semiconductor
Processes and Devices 2013”, (2013), pp. 45-48.