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Physical Quantities

Symbol   Unit   Description
$ e_{ij},\gamma_{ij}$   1   Engineering strain component $ (i,j)$
$ \varepsilon _{ij}$   1   Component $ (ij)$ of the strain tensor
$ T_{ij}$   GPa   Component $ (ij)$ of the stress tensor
$ C_{ijkl}$   GPa   Component $ (ijkl)$ of the elastic stiffness tensor
$ c_{ij}$   GPa   Component $ (ij)$ of the contracted stiffness tensor
$ S_{ijkl}$   GPa$ ^{-1}$   Component $ (ijkl)$ of the elastic compliance tensor
$ s_{ij}$   GPa$ ^{-1}$   Component $ (ij)$ of the contracted compliance tensor
$ \ensuremath {\mathrm{q}}\ensuremath {\chi_\mathrm{S}}$   eV   Electron affinity of the semiconductor
$ D_n$   m$ ^2$s$ ^{-1}$   Electron diffusion coefficient
$ D_p$   m$ ^2$s$ ^{-1}$   Hole diffusion coefficient
$ E$   Vm$ ^{-1}$   Electric field
$ \epsilon $   eV   Energy
$ \epsilon _c$   eV   Conduction band edge energy
$ \epsilon _v$   eV   Valence band edge energy
$ E_g$   eV   Band gap energy
$ \Phi$   V   Potential
$ \ensuremath {\mathrm{q}}\ensuremath {\Phi_\mathrm{MS}}$   eV   Work function difference between metal and semiconductor
$ D(\epsilon )$   m$ ^{-3}$eV$ ^{-1}$   Density of states
$ \ensuremath{\hbar\omega}$   eV   Phonon energy
$ \ensuremath{{\mathbf{J}}_n}$   Am$ ^{-2}$   Electron current density
$ \ensuremath{{\mathbf{J}}_p}$   Am$ ^{-2}$   Hole current density
$ k$   m$ ^{-1}$   Wave number
$ \mathbf{k}$   m$ ^{-1}$   Wave number vector
$ \epsilon_r$   1   Relative dielectric permittivity
$ \mu_r$   1   Relative magnetic permeability
$ \mu_n$   m$ ^2$V$ ^{-1}$s$ ^{-1}$   Electron mobility
$ \mu_p$   m$ ^2$V$ ^{-1}$s$ ^{-1}$   Hole mobility
$ \mu_\ensuremath{{\mathrm{eff}}}$   m$ ^2$V$ ^{-1}$s$ ^{-1}$   Effective electron mobility
$ m$   kg   Mass
$ \ensuremath{m_\mathrm{eff}}$   kg   Carrier effective mass in the semiconductor

Symbol   Unit   Description
$ n$   m$ ^{-3}$   Electron concentration
$ \ensuremath {n_\mathrm{i}}$   m$ ^{-3}$   Intrinsic concentration
$ \ensuremath {N_\mathrm{D}}$   m$ ^{-3}$   Concentration of donors
$ \ensuremath {N_\mathrm{A}}$   m$ ^{-3}$   Concentration of acceptors
$ \ensuremath {N_\mathrm{c}}$   m$ ^{-3}$   Effective density of states of the conduction band
$ \ensuremath {N_\mathrm{v}}$   m$ ^{-3}$   Effective density of states of the valence band
$ p$   m$ ^{-3}$   Hole concentration
$ t$   s   Time
$ \tau_i$   s   Momentum relaxation time
$ T$   K   Temperature
$ v$   ms$ ^{-1}$   Velocity
$ \mathbf{v}$   ms$ ^{-1}$   Velocity vector
$ \ensuremath{V_\mathrm{GS}}$   V   Gate-source voltage
$ \ensuremath{V_\mathrm{DS}}$   V   Drain-source voltage


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S. Dhar: Analytical Mobility Modeling for Strained Silicon-Based Devices