S. Dhar, G. Karlowatz, E. Ungersboeck, and H. Kosina.
Numerical and Analytical Modeling of the High-Field Electron
Mobility in Strained Silicon.
In Proc. Simulation of Semiconductor Processes and Devices, pages
223-226, 2005.
S. Dhar, G. Karlowatz, E. Ungersboeck, H. Kosina, and S. Selberherr.
Modeling of Velocity Field Characteristics in Strained
Si.
In Proceedings of the Fourteenth International Workshop on the
Physics of Semiconductor Devices, pages 1060-1063, 2005.
S. Dhar, H. Kosina, G. Karlowatz, E. Ungersboeck, T. Grasser, and
S. Selberherr.
A tensorial high-field electron mobility model for strained
silicon.
SiGe Technology and Device Meeting, ISTDM 2006, pages 72-73, 2006.
S. Dhar, H. Kosina, G. Karlowatz, S. E. Ungersboeck, T. Grasser, and
S. Selberherr.
High-Field Electron Mobility Model for Strained-Silicon
Devices.
IEEE Trans.Electron Devices, vol. 53, no. 12, pages 3054-3062, 2006.
M. Gröschl, R. Thalhammer, G. Karlowatz, E. Benes, and H. Nowotny.
Viscosity Monitoring with a quartz crystal thickness shear
resonator.
Proc. of the 1st Congress of the Alps Adria Acoustics Associaton,
pages 663-672, 2003.
G. Karlowatz, E. Ungersboeck, W. Wessner, and H. Kosina.
Full-Band Monte Carlo Analysis of Electron Transport in
Arbitrarily Strained Silicon.
In Proc. Simulation of Semiconductor Processes and Devices, pages
63-66, Monterey, USA, 2006.
G. Karlowatz, E. Ungersboeck, W. Wessner, H. Kosina, and S. Selberherr.
``Analysis of hole transport in arbitrarily strained germanium'',
volume 3 of ECS Transactions.
The Electrochemical Society, 2006.
G. Karlowatz, E. Ungersboeck, W. Wessner, H. Kosina, and S. Selberherr.
Analysis of Hole Transport in Arbitrarily Strained Germanium.
In Meeting Abstracts: 210th Meeting of The Electrochemical Society,
page 1449, 2006.
G. Karlowatz, W. Wessner, and H. Kosina.
Effect of Band Structure Discretization on the Performance of
Full-Band Monte Carlo Simulation.
Mathmod Vienna Proceedings, vol. 5, no. 1, pages 4.1-4.6, 2006.
G. Karlowatz, W. Wessner, and H. Kosina.
Effect of Band Structure Discretization on the Performance of
Full-Band Monte Carlo Simulation.
MATHCOM, vol. 79, no. 4, pages 972-979, 2008.
V. Sverdlov, G. Karlowatz, S. Dhar, H. Kosina, and S. Selberherr.
Two-band k
p model for the conduction band in silicon:
Impact of strain and confinement on band structure and mobility.
International Semiconductor Device Research Symposium, 2007.
ISBN: 978-1-4244-1892-3.
V. Sverdlov, G. Karlowatz, H. Kosina, and S. Selberherr.
Two-band k
p model for the conduction band in
silicon.
Proceedings European Simulation and Modeling Conference, pages 220 -
224, 2007.
ISBN: 978-90-77381-36-6.
V. Sverdlov, G. Karlowatz, E. Ungersboeck, and H. Kosina.
Influence of Uniaxial [110] Stress on the Silicon Conduction
Band Structure: Stress Dependence of the Nonparapolicity Parameter.
In Simulation of Semiconductor Processes and Devices, volume 12,
pages 329-332, Vienna, 2007.
V. Sverdlov, G. Karlowatz, S. Dhar, H. Kosina, and S. Selberherr.
Two-band k
p model for the conduction band in silicon:
Impact of strain and confinement on band structure and mobility.
Solid-State Electron., vol. 52, pages 1563-1568, 2008.
R. Thalhammer, S. Braun, B. Devcic-Kuhar, G. Karlowatz, M. Gröschl,
F. Trampler, E. Benes, H. Nowotny, and M. Koštal.
Viscosity Monitoring with a Quartz Crystal Resonator.
Journal of Electrical Engineering, vol. 54, no. 5-6, pages 140-143,
2003.
E. Ungersboeck, S. Dhar, G. Karlowatz, H. Kosina, and S. Selberherr.
Physical Modeling of Electron Mobility Enhancement for
Arbitrarily Strained Silicon.
In 11th International Workshop on Computational Electronics Book of
Abstracts, pages 141-142, 2006.
E. Ungersboeck, S. Dhar, G. Karlowatz, H. Kosina, and S. Selberherr.
Physical Modeling of Electron Mobility Enhancement for
Arbitrarily Strained Silicon.
Journal of Computational Electronics, vol. 6, no. 1-3, pages 55-58,
2007.
E. Ungersboeck, S. Dhar, G. Karlowatz, V. Sverdlov, H. Kosina, and
S. Selberherr.
The Effect of General Strain on the Band Structure and Electron
Mobility of Silicon.
IEEE Trans.Electron Devices, vol. 54, no. 9, pages 2183-2190, 2007.