Next: 2.4.2 Phase-Shifting Masks
Up: 2.4 Photomask
Previous: 2.4 Photomask
A binary mask consists of a transparent plate called blank, covered with
a patterned film of opaque material. The transmission characteristic
is a binary one, i.e., ``1'' for transparent and ``0'' for opaque.
The blank is made of soda lime, borosilicate glass, or fused quartz.
The advantages of quartz are
its good transparency even for DUV wavelengths at 246 nm or 193 nm
and its very low thermal
expansion coefficient. The low expansion coefficient becomes very important
for small minimum feature sizes and large die sizes. The opaque material
is typically a very thin (
100 nm) film of chrome, covered with an
anti-reflective coating, such as chrome oxide, to suppress interferences
at the wafer surface. High quality photomasks must meet stringent
requirements in flatness, accuracy of pattern placement, minimum feature
size, linewidth control over the entire mask area, and defect density.
The most common exposure tool to prepare binary masks is an
electron-beam system (cf. Section 2.7.3).
Up to 75% of electron-beam
generated masks have been observed as being defective and require repair.
Automatic mask
inspection techniques are available for repairing defects larger than
approximately 0.1 m in size. Typical defects are missing chrome,
pinholes in the chrome layer, or regions of unresolved chrome. Such defects
can be repaired by locally adding opaque material or removing
excess chrome with a laser beam or focused ion-beam.
Next: 2.4.2 Phase-Shifting Masks
Up: 2.4 Photomask
Previous: 2.4 Photomask
Heinrich Kirchauer, Institute for Microelectronics, TU Vienna
1998-04-17