| AAPSM | ... | Alternating Aperture Phase Shift Masks |
|---|---|---|
| ASCII | ... | American Standard Code for Information Interchange |
| NMOS | ... | n-type MOS |
| PMOS | ... | p-type MOS |
| BiCMOS | ... | Bipolar & Complementary MOS |
| BSIM | ... | Berkeley Short-Channel IGFET Model |
| CD | ... | Critical Dimension |
| CIF | ... | Caltech Intermediate Format |
| CMOS | ... | Complementary MOS |
| CMP | ... | Chemical Mechanical Polishing |
| COG | ... | Chrome on Glass |
| DFT | ... | Design for Test |
| DOE | ... | Design of Experiments |
| dpm | ... | Defective Parts Per Million |
| DRAM | ... | Dynamical RAM |
| DUT | ... | Device Under Test |
| EAPSM | ... | Embedded Attenuated Phase Shift Masks |
| ECAD | ... | Electronic Computer-Aided Design |
| EDA | ... | Electronic Design Automation |
| EEPROM | ... | Electrically Erasable Programmable Read-Only Memory |
| FET | ... | Field-Effect Transistor |
| GDSII | ... | Geometric Data Stream II |
| HTM | ... | Half Tone Masks |
| HTML | ... | Hypertext Markup Language |
| IC | ... | Integrated Circuit |
|---|---|---|
| I/O | ... | Input/Output |
| ITRS | ... | International Technology Roadmap for Semiconductors |
| IV | ... | Current(I)-Voltage |
| LDD | ... | Lightly Doped Drain |
| LOCOS | ... | Local Oxidation of Silicon |
| LSL | ... | Lower Specification Limit |
| MES | ... | Manufacturing Execution System |
| MOS | ... | Metal-Oxide-Semiconductor |
| MPU | ... | Microprocessor Unit |
| MPW | ... | Multi Product Wafer |
| MOSFET | ... | MOS Field-Effect Transistor |
| NTRS | ... | National Technology Roadmap for Semiconductors |
| NVM | ... | Non-Volatile Memory |
| OPC | ... | Optical Proximity Correction |
| OTP | ... | One Time Programmable Device |
| PCM | ... | Process Control Monitor |
| PCI | ... | Process Capability Index |
| PERL | ... | Practical Extraction and Reporting Language |
| POR | ... | Process of Record |
| ppb | ... | Parts Per Billion |
| ppm | ... | Parts Per Million |
| RAM | ... | Random-Access Memory |
| RIE | ... | Reactive Ion Etching |
| RTA | ... | Rapid Thermal Annealing |
| SDT | ... | Single Die Tooling |
| SIMS | ... | Secondary Ion Mass Spectroscopy |
| SLM | ... | Scribe Line Monitor |
| SMU | ... | Source Measure Unit |
| SOC | ... | System On a Chip |
| SPICE | ... | Simulation Program with Integrated Circuit Emphasis |
| SPR | ... | Simple Process Representation |
| SRAM | ... | Static Random-Access Memory |
| TCAD | ... | Technology Computer-Aided Design |
| TEM | ... | Transmission Electron Microscopy |
| USL | ... | Upper Specification Limit |
| UV | ... | Ultraviolet |
| VBIC | ... | Vertical Bipolar Intercompany Model |
| VHDL | ... | Very High Speed Integrated Circuit Hardware Description Language |
| WIP | ... | Work in Process |