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3.3.3 Total Electromigration Strain
The total strain induced by electromigration is given by the sum of the vacancy migration and vacancy generation/annihilation components,
|
(3.40) |
Taking the time derivative of (3.40), and using (3.35) and (3.39), the total strain rate produced by electromigration is given by
|
(3.41) |
Since
is a diagonal tensor with equal entries, one can write (3.41) in terms of the trace of the strain tensor
|
(3.42) |
Given the dependence of the electromigration induced strain on the source function , the modeling approach for mechanisms of generation and annihilation of vacancies becomes of crucial importance.
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Up: 3.3 Electromigration Induced Stress
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R. L. de Orio: Electromigration Modeling and Simulation