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3.3.3 Total Electromigration Strain

The total strain induced by electromigration is given by the sum of the vacancy migration and vacancy generation/annihilation components,

$\displaystyle \symStrain^{v}_{ij} = \symVacMigStrain + \symVacGenStrain.$ (3.40)

Taking the time derivative of (3.40), and using (3.35) and (3.39), the total strain rate produced by electromigration is given by

$\displaystyle \ensuremath{\ensuremath{\frac{\partial \symStrain^{v}_{ij}}{\part...
...tor)\ensuremath{\nabla\cdot{\vec\JV}} + \symVacRelFactor\G\right]\symKronecker.$ (3.41)

Since $ \symStrain^{v}_{ij}$ is a diagonal tensor with equal entries, one can write (3.41) in terms of the trace of the strain tensor

$\displaystyle \ensuremath{\ensuremath{\frac{\partial \symStrain^{v}}{\partial t...
...\symVacRelFactor)\ensuremath{\nabla\cdot{\vec\JV}} + \symVacRelFactor\G\right].$ (3.42)

Given the dependence of the electromigration induced strain on the source function $ \G$, the modeling approach for mechanisms of generation and annihilation of vacancies becomes of crucial importance.


next up previous contents
Next: 3.4 Vacancy Sinks and Up: 3.3 Electromigration Induced Stress Previous: 3.3.2 Strain due to

R. L. de Orio: Electromigration Modeling and Simulation