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... | step, difference, change |
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... | metal workfunction difference potential |
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... | exponent |
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... | exponent |
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... | electron, hole, and general exponents in mobility models |
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... | exponent in mobility models |
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... | barrier height lowering |
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... | dielectric constant |
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... | dielectric constant of semiconductor, insulator |
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... | relative dielectric constant |
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... | lattice thermal conductivity |
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... | thermal conductivity of electron and hole gas |
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... | mobility of carrier type ![]() |
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... | mobility due to lattice scattering |
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... | mobility due to lattice and impurity scattering |
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... | mobility due to lattice, impurity, and surface scattering |
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... | mobility including lattice, impurity, surface scattering, and high-field reduction |
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... | mobility including lattice, impurity, surface scattering, and high-temperature reduction |
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... | electron and hole mobilities |
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... | mass density |
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... | surface (interface) charge density |
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... | oxide conductivity |
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... | trap capture cross sections for electrons and holes |
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... | recombination lifetimes for electrons and holes |
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... | energy relaxation times for electrons, holes, and general carrier type |
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... | semiconductor contact potential |
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... | metal quasi-Fermi level |
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... | quasi-Fermi potentials for electrons and holes |
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... | electrostatic potential |
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... | built-in potential |
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... | net doping concentration |
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... | bandgap bowing parameter |
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... | mobility bowing parameter |
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... | relative carrier mass bowing parameter |
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... | dielectric flux |
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... | local electric field |
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... | local electric field in semiconductor |
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... | local electric field in insulator |
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... | electric field orthogonal to the interface |
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... | local band edge energy for electrons or holes |
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... | local band edge energy for electrons |
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... | bandgap energy |
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... | bandgap energy at 0 K, and at 300 K |
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... | intrinsic Fermi level |
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... | energy offset |
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... | valence band energy |
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... | workfunction energy difference |
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... | driving force for electrons and holes |
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... | heat generation |
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... | emitter, base, collector currents |
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... | electron and hole current densities |
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... | valley degeneracy factor of the conduction band |
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... | number of electrons of a given chemical element |
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... | acceptor doping concentration |
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... | effective density of states for electrons |
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... | effective density of states for electrons evaluated at
reference temperature ![]() |
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... | donor doping concentration |
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... | trap density |
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... | effective density of states for holes |
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... | effective density of states for holes evaluated at
reference temperature ![]() |
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... | total charge in the device |
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... | net recombination rate |
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... | Auger recombination rate |
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... | band to band tunneling recombination rate |
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... | impact ionization recombination rate |
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... | SRH net recombination rate |
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... | global thermal resistance |
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... | thermal resistance |
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... | surface recombination velocities for electrons and holes |
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... | electron and hole heat flux density |
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... | lattice heat flux density |
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... | contact temperature |
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... | local lattice temperature |
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... | electron and hole temperatures |
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... | voltage drop over the oxide at the polysilicon contact |
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... | base-to-emitter voltage, collector-to-emitter voltage |
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... | Coulomb potential |
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... | atomic number of a given chemical element |
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... | lattice heat capacity (specific heat) |
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... | heat capacity of electron gas and hole gas |
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... | thickness, length |
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... | effective tunneling length |
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... | oxide thickness |
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... | current gain cutoff frequency |
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... | maximum frequency of oscillation |
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... | transconductance |
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... | Planck constant |
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... | reduced Planck constant |
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... | Boltzmann constant |
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... | gatelength |
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... | free electron mass |
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... | relative masses of electrons and holes |
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... | a normal vector |
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... | electron concentration |
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... | intrinsic concentration |
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... | hole concentration |
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... | elementary charge |
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... | time |
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... | thermal velocities at 300 K for electrons and holes |
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... | electron and hole saturation velocities |
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... | average electron energy |
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... | surface reference distance |