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- Q1
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R. Quay, R. Reuter, V. Palankovski, and S. Selberherr, ``S-Parameter
Simulation of RF-HEMTs,'' Proc. High Performance Electron
Devices for Microwave and Optoelectronic Applications
(Manchester), pp. 13-18, 1998.
- Q2
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R. Quay, C. Moglestue, V. Palankovski, and S. Selberherr,
``A Temperature Dependent Model for the Saturation Velocity
in Semiconductor Materials,''
in Abstracts E-MRS Spring Meeting,
(Strasbourg), p. L-7, 1999.
- Q3
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R. Quay, V. Palankovski, R. Reuter, M. Schlechtweg, W. Kellner, and
S. Selberherr, ``III-V Device Optimization by Physics-Based
S-Parameter Simulation,'' Proc. 26 Intl. Symp. Compound
Semiconductors, (Berlin), pp. 325-328, 1999.
- Q4
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V. Palankovski, R. Quay, S. Selberherr, and R. Schultheis, ``
S-Parameter Simulation of HBTs on Gallium-Arsenide,'' Proc.
High Performance Electron Devices for Microwave and
Optoelectronic Applications, (London), pp. 15-19, 1999.
- Q5
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R. Quay, R. Reuter, T. Grasser, and S. Selberherr, ``Thermal
Simulations of III/V HEMTs, ''Proc. High Performance Electron
Devices for Microwave and Optoelectronic Applications, (London),
pp. 87-91, 1999.
- Q6
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R. Quay, C. Moglestue, V. Palankovski, and S. Selberherr, ``A
Temperature Dependent Model for the Saturation Velocity in
Semiconductor Materials, Mater. Sci. Semicond. Process.,
vol. 3, no. 1-2, pp. 149-155, 2000.
- Q7
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R. Quay, H. Massler, W. Kellner, T. Grasser, V. Palankovski, and
S. Selberherr, ``Simulation of Gallium-Arsenide Based High
Electron Mobility Transistors,'' Proc. Intl. Conf. on Simulation
of Semiconductor Processes and Devices, (Seattle), pp. 74-77, 2000.
- Q8
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V. Palankovski, R. Quay, S. Selberherr, and R. Schultheis, ``Analysis
of HBT Behaviour after Strong Electrothermal Stress,''Proc.
Intl. Conf. on Simulation of Semiconductor Processes and Devices,
(Seattle), pp. 245-248, 2000.
- Q9
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T. Grasser, V. Palankovski, R. Quay, and S. Selberherr, ``A Global
Self-Heating Model for Device Simulation,'' Proc. 30
European Solid-State Device Research Conference, (Cork),
pp. 324-327, 2000. (W.A. Lane, G.M. Crean, F.A. McCabe, H. Grünbacher,
eds.), Frontier Group.
- Q10
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V. Palankovski, R. Quay, and S. Selberherr, ``Industrial Application
of Heterostructure Device Simulation,'' Proc. GaAs-IC Symp.,
(Seattle), pp. 117-120, (invited), 2000.
- Q11
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R. Quay, V. Palankovski, M. Chertouk, A. Leuther, and S. Selberherr,
``Simulation of InAlAs/InGaAs High Electron Mobility Transistors
with a Single Set of Physical Parameters,''Intl. Electron
Devices Meeting Tech. Dig, (San Francisco), pp. 186-189, 2000.
- Q12
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R. Quay, K. Hess, R. Reuter, M. Schlechtweg, T. Grave, V. Palankovski, and
S. Selberherr, ``Nonlinear Electronic Transport
and Device Performance of HEMTs, IEEE Trans. Electron
Devices, vol. 48, no. 2, pp. 210-217, 2001.
- Q13
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R. Quay, R. Schultheis, W. Kellner,
V. Palankovski, and S. Selberherr, ``A Review of Modeling Issues for
RF Heterostructure Device Simulation,''
Proc. Intl. Conf. on Simulation of Semiconductor Processes and Devices, (Athens), pp. 432-435,2001.
- Q14
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V. Palankovski, R. Quay, and S. Selberherr,
``Industrial Application of Heterostructure Device Simulation,''
IEEE J. Solid-State Circuits, (invited), vol. 36, no. 9, pp. 1365-1370, 2001.
Quay
2001-12-21