The first SiC power transistors were vertical trench U-shape metal-oxide-semiconductor
field-effect-transistors (UMOSFETs) reported by Cree Inc. in 1992 [51]. The technology
for the fabrication of this structure was derived from the trench etching techniques developed
for the storage capacitor in silicon memories. In this section simulation-based analysis of
this type of transistor geometry is performed. Repetitive calibration steps have been carried out to
determine the exact value of the model parameters which give the desired forward and reverse
biased characteristics.
Subsections