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List of Abbreviations and Acronyms

BJT ... Bipolar junction transistor
BTI ... Bias temperature instability
CETD ... Critical electron trap density
CHE ... Channel hot electron
CMOS ... Complementary MOS
CV ... Capacitance-voltage
DAHC ... Drain avalanche hot carrier
DCIV ... Direct current current voltage
DOS ... Density of states
DRAM ... Dynamic random access memory
DUT ... Device under test
ESD ... Electrostatic discharge
ESR ... Electron spin resonance
GPV ... Gate pulsed voltage
HBM ... Human body model
IV ... Current-voltage
MOS ... Metal-oxide-semiconductor
MOSFET ... MOS field-effect transistor
NBT ... Negative bias temperature
NBTI ... Negative bias temperature instability
nMOSFET ... n-channel MOSFET
pMOSFET ... p-channel MOSFET
SDR ... Spin dependent recombination
SGHE ... Secondary generated hot electron
SHE ... Substrate hot electron
SILC ... Stress-induced leakage current
SNM ... Static noise margin
SRAM ... Static random access memory
SRH ... Shockley-Read-Hall
TAT ... Trap assisted tunneling
TCAD ... Technology computer-aided design
TDDB ... Time dependent dielectric breakdown
VTC ... Voltage transfer characteristic
VLSI ... Very large scale integration


next up previous contents
Next: 1. Introduction Up: Dissertation Robert Entner Previous: Contents

R. Entner: Modeling and Simulation of Negative Bias Temperature Instability