The lattice temperature enters the gate tunneling current via the electron
energy distribution functions in the polysilicon gate and in the channel. The
transmission coefficient, being based on quantum-mechanical reasoning alone,
is not affected by the lattice temperature. However, the supply function
depends on the lattice temperature. The impact on the gate current density is
shown in Fig. 5.9. Rising temperature increases the
tunneling current density in all cases.
Figure 5.9:
Effect of the lattice temperature on electron tunneling current (left)
and hole tunneling current (right) in an nMOS (top) and a pMOS (bottom) with
2 nm dielectric thickness, 1e20 cm-3 polysilicon and 5e18 cm-3 substrate doping.