Although the non-radiative multi-phonon (NMP) model of Chapter 8.5.3 appears to be the best modeling approach so far, it still suffers from some limitation when used for BTI. First it is not able to fully explain the uncorrelated behavior of the capture and emission times as observed experimentally and second it does not give a stronger than linear field dependence of the capture time constants of the defects though these are observed [169].
When modeling random telegraph noise (RTN) twenty years ago Uren
et al. [170] suggested that individual states can exist in more than one
charge-equivalent, so-called metastable states. Based on this idea the two possible
states of the NMP model are now extended to a four-state defect system [111].
Such a multi-state defect model is depicted in Fig. 9.3 (top) for the oxygen
vacancy. It contains two metastable defect states and
which belong to the
already used stable states
and
, respectively. As can be seen the
transitions between
and
now have to proceed over one of the metastable
states. This picture is similar to that already used in the two-stage model,
cf. Chapter 8.4, where the oxygen vacancy upon hole capture (state
3) was regarded to be in a kind of metastable state with the choice to
either structurally relax or to recapture a hole again. In the multi-state
defect model, again the oxygen vacancy is used as switching oxide trap
[147, 111].
With the help of a schematic reaction coordinate diagram in Fig. 9.3
(bottom) the transitions of a single defect state are now explained. The
neutral defect state and the charged defect state
are depicted
together with their corresponding metastable states
and
. Upon the
application of a stress bias, the charge transfer reaction from state
to
is
favored. This is indicated by the dashed upwards shift of the parabola in
Fig. 9.3 (bottom) and leads to a strong electric field dependence of the
barrier [111, 157]. As
is metastable it can relax into its stable form
afterwards.
By performing DFT calculations in crystalline , Schanovsky et al.
concluded that the oxygen vacancy does not fulfill all requirements of the
multi-state model. This is because its thermodynamic energy level of around
above the
valence band results in a very high barrier for the capture
process, which can only be surmounted at very high oxide electric fields.
Unfortunately the necessary fields are around
when assuming the
defect to be localized
inside the oxide[151]. Another problem of the
oxygen vacancy is that its neutralized puckered state
is too unstable
to allow a switching trap behavior between state
and
, as the
defect would rather relax back to its initial state
immediately
[138].
For the sake of completeness also the hydrogen bridge is briefly discussed. According to first principle calculations its energy level was determined to lie within the Si bandgap, meaning that the defect configuration is already positively charged prior to stress. Therefore the hydrogen bridge is ruled out as possible defect state when dealing with BTI as well [151].
However, no matter what exact defect configuration is responsible for BTI, the multi-state defect model captures the essence of BTI very accurately and will therefore be used in the following. Its hole capture and emission rates are derived similarly to Chapter 8.1, with the barriers based on the NMP formalism, cf. Appendix D.2
The indices of the barriers
![]() | (9.5) |
Analogously the effective transition from to
over the metastable states can
be derived to be
![]() | (9.6) |
These reaction rates then define the specific capture and emission time constants
and
, respectively, within which the single defect is
charged and discharged on average.
During stress the effective forward rate can be approximated to the
transition over state
, as already indicated in Fig. 9.3 (bottom). However,
during relaxation transitions over both metastable states contribute, also
indicated by arrows. After Grasser et al. [111] switching trap behavior in the
multi-state defect model is only observed when both barriers between state
and
are rather small compared to
. Consequently, switching traps favor
the backward process over
. For defects featuring a large barrier
on the other hand no such switching trap behavior can be observed,
since they practically never reach state
, they have to recover via
.