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The AlGaAs/GaAs and InGaP/GaAs HBTs benefit from a single heterojunction formed
between the AlGaAs wide bandgap emitter and the GaAs p-type base. InP/InGaAs
and InAlAs/InGaAs grown on InP substrate gives double heterojunction devices as
both emitter and collector regions include wide bandgap materials.
In terms of speed the III-V HBTs are among the fastest devices. Transit
frequencies
of about 150 GHz and maximum oscillation frequencies
of more than 250 GHz [14,15] were reported for HBTs on GaAs. Transfer
substrate InAlAs/InGaAs HBTs on GaAs with
250 GHz [16] and
record InP-based HBTs with
800 GHz were demonstrated [17] but
they are still lacking level of integration (1000 transistors per chip)
compared to the GaAs-based HBTs. Table 2.1 summarizes state-of-the-art
HBTs from different technologies with their impressive cutoff frequencies.
Table 2.1:
High-frequency properties of state-of-the-art HBTs
Substrate |
Emitter/Base |
[GHz] |
[GHz] |
References |
GaAs |
AlGaAs/GaAs |
83 |
253 |
Matsushita, 1995 [18] |
GaAs |
AlGaAs/InGaAs |
140 |
250 |
NEC, 1998 [14] |
GaAs |
InGaP/GaAs |
156 |
256 |
Hitachi, 1998 [15] |
(GaAs) |
InAlAs/InGaAs |
251 |
233 |
UC Santa Barbara, 1998 [16] |
InP |
InAlAs/InGaAs |
162 |
820 |
UC Santa Barbara, 1999 [17] |
InP |
InP/GaAsSb |
216 |
240 |
SFU Burnaby, 2000 [19] |
Si |
Si/SiGe |
154 |
48 |
Hitachi, 2000[20] |
|
|
122 |
163 |
Hitachi, 2000[21] |
|
Heterostructure field-effect transistors HFETs, and especially HEMTs, cover
higher frequencies (see Table 2.2), have higher PAE than III-V HBTs
and show comparable breakdown voltages. However, their low level of integration
(100 transistors per chip) and 10% larger chip size lead to higher cost
of production. In addition, the breakdown voltages cannot be so easily
controlled as in HBTs, due to the influence of surface effects. The III-V
market tendency in the last two years shows the increasing importance of HBTs
(see Table 2.3).
Table 2.2:
Shares of HBTs, HEMTs, and MESFETs on the III-V market
Substrate |
Channel |
[GHz] |
[GHz] |
[nm] |
References |
InP |
lattice-matched |
350 |
350 |
30 |
NTT, 1998 [22] |
InP |
pseudomorphic |
340 |
250 |
50 |
Hughes, 1992 [23] |
InP |
graded |
305 |
340 |
100 |
TRW, 1994 [24] |
GaAs |
metamorphic |
204 |
188 |
180 |
UI Urbana, 1999 [25] |
GaAs |
metamorphic |
188 |
312 |
150 |
DaimlerChrysler, 2000 [26] |
Table 2.3:
High-frequency properties of state-of-the-art HFETs
|
MESFET |
HEMT |
HBT |
1998 |
75% |
8% |
17% |
2000 |
60% |
10% |
30% |
|
GaAs MESFETs and MESFET-based monolithic microwave integrated circuits (MMICs)
are still key parts of the existing cellular phones, as they offer acceptable
performance at a reasonable cost [27]. However, drawbacks are the
need of double voltage supply and the large chip size. High PAE is needed to
increase the battery lifetimes. HBTs are devices which at higher material cost
offer high performance.
The III-V HBTs are considered essential for high-power amplifiers at 3 V power
supply, as they offer high current amplification and PAE at 0.9/1.8 GHz
[28]. A small chip-size 2 W MMIC based on AlGaAs/GaAs HBTs with
record performance for wireless applications (62% PAE at 1.8 GHz) was
demonstrated in [27]. Considering higher frequencies for future
wireless applications InP-based and even SiGe MMICs with excellent performance,
48% and 24 % PAE respectively, at 25 GHz were recently reported
[29,30] (see Table 2.4).
Table 2.4:
HBT IC applications
Substrate |
Emitter/Base |
/
[GHz] |
Advantage |
References |
GaAs |
AlGaAs/GaAs |
- |
62% PAE at 2 W |
Siemens, 1998 [27] |
InP |
InGaAs/InAlAs |
70/120 |
48% PAE at 25 GHz |
TRW, 1999 [29] |
InP |
InP/InGaAs |
116/169 |
40 Gb/s at 72 GHz |
NTT, 1999 [25] |
Si |
Si/SiGe |
-/60 |
ECL gate delay 5.5 ps |
Hitachi, 2000 [21] |
Si |
Si/SiGe |
50/50 |
24% PAE at 25 GHz |
Daimler, 2000 [30] |
|
A further advantage of III-V HBTs is the low phase noise figure making them
attractive for digital applications. Digital ICs with AlGaAs/GaAs and
InP/InGaAs HBTs are used for fiber-optic transmission of 40 Gb/s and 60 Gb/s,
respectively.
Next: 2.1.3 Future
Up: 2.1 State-of-the-art Heterostructure Devices
Previous: 2.1.1 Why and Where
Vassil Palankovski
2001-02-28