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In the previous section two-dimensional simulations of one-finger power HBTs on
GaAs are presented. A good agreement of simulations of four different types of
devices with measured data in a wide temperature range is demonstrated. In
addition, it is possible by accounting properly for self-heating to simulate
correctly the output device characteristics. Considering the ability to
reproduce correctly the DC-device behavior including thermal aspects the work
is extended with transient simulation of small-signal parameters to connect DC-
and RF- device operation. In the following subsections a comparison of
simulated and measured S-parameters and the dependence of
on some device
parameters are presented.
Figure 4.23:
T-like eight-element small-signal HBT equivalent circuit
used for S-parameter calculation
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Subsections
Vassil Palankovski
2001-02-28