The basic semiconductor equations which are derived from Maxwell's equations
determine a relation among the electric and magnetic field, the space charge density and the
current density given by [104]
(3.3)
(3.4)
(3.5)
(3.6)
where
and
are the electric and magnetic fields, and
and
are the induction and displacement vectors, respectively. Furthermore,
is the space charge density, and
the conduction current density.
The expressions (3.3) through (3.6) are linked by the relations
(3.7)
(3.8)
where
and are the permittivity and permeability tensors, respectively.
Equations (3.7) and (3.8) are valid only in materials where no piezoelectric or
ferroelectric phenomena occur. The frequency dependence of
and can be
neglected.
Combining the fourth MAXWELL equation (3.6) with (3.7) and
(3.8) to make it applicable for semiconductor problems, and substituting the space
charge density by the algebraic sum of the charge carrier densities and the ionized
impurity concentrations
(3.9)
one arrives at the POISSON equation for anisotropic materials, determining the electrostatic
potential , given by
(3.10)
where
is the elementary charge, () is the charge carrier density of electrons
(holes), and
(
) is the concentration of ionized donors
(acceptors). The permittivity tensor
has the same form as the representative
tensor in (3.2).
The continuity equations (3.11)
and (3.12) are the conservation laws for the carriers. They are derived from the
third MAXWELL equation (3.5) for the flow of electrons and holes, and
maintain their usual form in anisotropic materials as well.
(3.11)
(3.12)
The quantity R describes the net generation or recombination rate of electrons and holes and is
modeled explicitly in Section 3.5.