Although many analysis tasks for contemporary devices can be performed using
two-dimensional simulation there exist several advanced device structures which
need full three-dimensional simulation for the prediction of the device
behavior. Some of these devices have been studied using the three-dimensional
device simulator Minimos-NT, namely the superjunction lateral diffused MOSFET, the
magnetic field sensitive MOSFET, a silicon on insulator MOSFET, and the FinFET.