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List of Figures
4.1.
Resulting current density from the double grid discretization featuring distinct solution curves from the odd and the even grid points.
4.2.
Unphysical oscillations in the equilibrium electron density.
4.3.
Relative error (ratio) of the closure for bulk and for the
nm device. Error from cumulant closure increases with high bias. Best fit for
.
4.4.
Comparison of the average velocity obtained from the SM and ET models with the self-consistent Monte Carlo simulation for the
nm device.
4.5.
Comparison of the kurtosis obtained from the SM and ET models with the self-consistent Monte Carlo simulation for the
nm device.
4.6.
Comparison of the device currents obtained from the SM and ET models with the self-consistent Monte Carlo simulation for varying channel length.
5.1.
Conduction band edge of the RTD for different voltages. A linear voltage drop is assumed over a distance of 40 nm.
5.2.
Influence of phonon scattering on the I/V characteristics of an RTD
7.1.
The self-consistent potential entering the Schrödinger equation is obtained as a sum from the solution of the Poisson equation and the offset from the bandgap.
8.1.
Wigner distribution function. Density is very low in large parts of the simulation domain.
9.1.
Pair generation rate
caused by the Wigner potential for two different voltages
9.2.
The trajectory split algorithm: At each scattering event the weight of the trajectory is multiplied by 3 and a particle-antiparticle pair is generated.
10.1.
I-V curve comparing Wigner and von Neumann simulation
10.2.
Wigner simulation: Comparing ``naive'' and ``correct'' formula for current density at maximum bias
10.3.
Comparing carrier density from Wigner and von Neumann simulation
10.4.
Effect of the coherence length in Wigner simulations
10.5.
Spikes in the transmitted current density resulting from sharp resonances
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11.3 Closing Words
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Dissertation R. Kosik
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R. Kosik: Numerical Challenges on the Road to NanoTCAD