In Section 5.1 we showed that an extra gate close to the drain-sided
SCHOTTKY barrier can effectively suppress the parasitic current, which results from ambipolar
conduction. However, due to some technological limitations using an extra gate
may not be suitable for some applications. In this section we show that by
asymmetric scaling of the gate-source and gate-drain spacer length of a
single-gate device the ambipolar conduction can be reduced. Furthermore,
appropriate selection of the gate-source and gate-drain spacer length results
in considerable reduction of parasitic capacitances. As a result, improved
device characteristics can be achieved. Results for devices with different
barrier heights at the metal-CNT interface are discussed.