Professors
![]() |
|
|||
![]() |
Electromigration-Induced Growth of Silicon Nanowires |
![]() |
|
|||
![]() |
Physics-Informed Compact Modeling for Design-Technology Co-Optimization |
![]() |
|
|||
![]() |
Numerical Modeling of Nanostructured Semiconductor Devices |
![]() |
|
|||
![]() |
Edge Modes Conductance in Narrow MoS2 Nanoribbons in a Topological Phase |
![]() |
|
|||
![]() |
Challenges for Electronic Circuits Made from Devices Based on 2D Materials |
![]() |
|
|||
![]() |
Coherent Wigner Dynamics in a Tunable Barrier Quantum Dot |
Administration
Researchers
![]() |
|
|||
![]() |
A Multi-Level Cell for Ultra-Scaled STT-MRAM Realized by Back-Hopping |
![]() |
|
|||
![]() |
Solving the Schrödinger-Poisson Equation on GPUs |
![]() |
|
|||
![]() |
Variability due to Interfacial Disorder in Si-based Spin Qubits |
![]() |
|
|||
![]() |
Exploring Bi2SeO5 as a Promising Gate Insulator for 2D Semiconductor-Based Field-Effect Transistors |
![]() |
|
|||
![]() |
Improving the Energy Efficiency of SOT-Assisted STT-MRAM with Reinforcement Learning |
![]() |
|
|||
![]() |
Monte Carlo Methods for Solving The Winger Equation in Linear Electromagnetic Fields |
![]() |
|
|||
![]() |
Impact of Bias Temperature Instability on the Performance of SiC-based MOSFETs for High Power Electronics |
![]() |
|
|||
![]() |
Comphy – A Compact Physics Framework for the Simulation of Reliability Issues in 2D Nanoelectronics. |
![]() |
|
|||
![]() |
Improved Stability of 2D Material-Based Transistors by Fermi-Level Tuning |
![]() |
|
|||
![]() |
Exploring the Global Structure of the Solution Space for a Simple Schrödinger-Poisson Model |
![]() |
|
|||
![]() |
Automatic Differentiation in Scientific Computing |
![]() |
|
|||
![]() |
Machine Learning-Based Molecular Dynamics Accelerated by Neuromorphic Hardware |
![]() |
|
|||
![]() |
Impact of Voltage-Controlled Magnetic Anisotropy on Spin-Orbit Torque MRAM Switching |
![]() |
|
|||
![]() |
Fabrication of 2D-FET Devices with Emerging Gate Insulator Materials and Their Reliability Analysis |
![]() |
|
|||
![]() |
Capacitance-Voltage Measurements using a Mercury Prober |
![]() |
|
|||
![]() |
Impact of Defects on the Threshold Voltage Drift in pMOS Transistors Employing SiO2 |
![]() |
|
|||
![]() |
Modeling the Hysteresis in the Current-Voltage Characteristics of Trench 4H-SiC MOSFETs |