The inverter delay
is determined by the drive current
,
,
the non-linear capacitances of the intrinsic transistors, and the
interconnect capacitances.
The capacitances are modeled into a single load capacitance at the
inverter output (cf. Fig. 3.5 and (3.20)).
An effective load capacitance
including interconnects is
then determined as
The factors k1 and k2 are used to scale the data of one device
to obtain the delay of a CMOS inverter.
They account for the average drive current
and for the
effective total capacitance
.
Typically, for a CMOS inverter with minimum-size transistors these
factors are k1 = 0.75 and k2 > 2 for NMOS data.
The empirical correction factor k3 is typically < 1
and accounts for the fact that in a circuit the output nodes
start to switch before the input pulse edge is complete.
k3 was determined from device-level simulations of a ring
oscillator with MINIMOS-NT [72] as follows:
setting
and
,
yields
,
where
td,osc is the reference delay time determined from the ring
oscillator. Using the devices of Section 3.3.8 k3 was
found to be 0.63.
The value of k3 does not change much with technology.
Evaluating (2.21) with the same value of k3 for a completely different
technology (an ultra-low-power technology with Vdd=0.2V [61])
using both NMOS and PMOS data gave an error of -22%.
Although (2.21) and (3.22) are generally not very accurate, they reflect the various tendencies very closely and are therefore well-suited for optimization purposes. Furthermore, the device characterization method which is specific to this approach can be combined with a more detailed system model (cf. [22]) to account for the effect of the particular circuit design style and metalization scheme.
An alternative to using the on-state current directly is to compute an
effective turn-on current
from an output curve (4b) as follows: