Professors

Tibor Grasser
Ao.Univ.Prof. Dipl.-Ing. Dr.techn.,
Head of Institute
 Preface
Erasmus Langer
Ao.Univ.Prof. i.R. Dipl.-Ing. Dr.techn.
 Preface
Siegfried Selberherr
O.Univ.Prof. Dipl.-Ing. Dr.techn. Dr.h.c.
 Preface
Hajdin Ceric
Associate Prof. Dipl.-Ing. Dr.techn.
 Reliability Characterization of Interconnects Based on Copper and Copper-Replacement Metals
Hans Kosina
Ao.Univ.Prof. Dipl.-Ing. Dr.techn.
 Electronic Transport in Semiconductor Devices and Nanostructures
Viktor Sverdlov
Privatdoz. MSc PhD
 Advanced Spin-Orbit Torque MRAM Cells

Administration

Ewald Haslinger
Manfred Katterbauer
Dipl.-Ing. (FH)
Diana V. Pop
MA MSc
Renate Winkler

Researchers

Luiz Felipe Aguinsky
MSc
Majid Benam
MSc
 A Wigner Potential Decomposition in the Signed-Particle Approach
Johann Cervenka
Senior Scientist Dipl.-Ing. Dr.techn.
 The Deterministic Wigner Approach to Superposed States
Georgios Diamantopoulos
MSc
 A Shared-Memory Parallel Multi-Mesh Fast Marching Method for Re-Distancing Problems
Al-Moatasem El-Sayed
MChem. PhD
 The Effect of Electric Fields on Point Defects
Lado Filipovic
MSc Dr.techn.
 Reliability of Metallic Microheaters for SMO Gas Sensors
Milica Gadjanski
Dipl.-Ing. Dr.techn.
 The Haasen-Alexander-Sumino Model and the Thermo-Mechanical Deformation of Silicon Wafers
Manuel Gillinger
Dipl.-Ing. Dr.techn.
Lukas Gnam
Dipl.Ing
 A Flexible Coarse-Grained Shared-Memory Parallel Mesh Adaptation Workflow
Alexander Grill
Dipl.-Ing.
 Single Defect Characterization Using Hidden Markov Models
Yury Illarionov
MSc PhD Dr.techn.
 Single-Layer MoS2 Field-Effect Transistors with 109 On/Off Current Ratios and Improved Reliability
Markus Jech
Dipl.-Ing.
 The Impact of Mixed-Mode Stress on the Dynamics of Oxide Defects
Markus Kampl
Dipl.-Ing.
 Numerical Algorithms and Physical Models for Monte Carlo Device Simulation
Xaver Klemenschits
MSc
 A Unified Feature Scale Model for Etching in SF6 and Cl Plasma Chemistries
Theresia Knobloch
Dipl.-Ing.
 The Role of Contacts in MoS2 Field-Effect Transistors
Robert Kosik
Dipl.-Ing. Dr.techn.
 Numerical Comparison of the Sigma Equation and the Wigner Equation
Ayoub Lahlalia
MSc
 Improved Capability of Integrated Semiconducting Metal Oxide Gas Sensor Devices
Alexander Makarov
MSc Dr.techn.
 Physics-Based Modeling of Hot-Carrier Degradation in FinFETs
Paul Manstetten
MSc Dipl.-Ing.(FH) Dr.techn.
 Sparse Surface Speed Evaluation Using an Iterative Partitioning Scheme
Etienne Navarro
Dr.
Mihail Nedjalkov
MSc PhD (Phys.) DSc (Math.)
 Electron-Dopant Potential Interaction in Nanowires
Michael Quell
Dipl.-Ing. BSc
Karl Rupp
MSc Dipl.-Ing. Dr.techn.
 Parallel Semiconductor Device Simulation
Gerhard Rzepa
Dipl.-Ing. Dr.techn.
 Comphy: A Compact-Physics Framework for the Unified Modeling of Bias Temperature Instabilities
Vito Simonka
Mag. Fiz.
 Modeling of Silicon Carbide Dopant Activation During Post-Implantation Annealing
Bernhard Stampfer
Dipl.-Ing.
 Characterization of Single Defects in MoS2 Field-Effect Transistors
Michael Thesberg
PhD
 Numerical Approaches in Quantum Transport and the Study of Renewable Energy Technologies
Stanislav Tyaginov
Phd Senior Postdoc
 Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach
Bianka Ullmann
Dipl.-Ing. Dr.techn.
Michael Waltl
Senior Scientist Dipl.-Ing. Dr.techn. BSc
 Improved Measurement Set-Up for Silicon-Carbide MOS Transistor Defect Spectroscopy
Josef Weinbub
Senior Scientist Dipl.-Ing. Dr.techn. BSc
 Lense-Governed Wigner Signed Particle Quantum Dynamics for Entangletronics
Yannick Wimmer
Dipl.-Ing. Dr.techn.
 Hydrogen Hopping in Amorphous SiO2
Thomas Windbacher
Dipl.-Ing. Dr.techn.