Professors
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TCAD Methods for the Study of Reliability and Performance of Nano-Interconnects | ![]() |
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Electronic Transport in Semiconductor Devices and Nanostructures | ![]() |
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Sensitive Strain Gauge Sensors Based on Two-Dimensional Materials | ![]() |
Administration
Researchers
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Simulation of Time-Resolved Quantum Transport with Scattering for Novel Nanoelectronics | ![]() |
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Impact of Fabrication on the Electrical Performance of Through Silicon Vias | ![]() |
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Towards a Unified Model for Bias Temperature Instability and Hot Carrier Degradation | ![]() |
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Investigation of Hot Carrier Effects in Semiconductor Devices using Backward Monte Carlo | ![]() |
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Using One-Dimensional Radiosity to Model Neutral Flux in Convex High Aspect Ratio Structures | ![]() |
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Electromigration Induced Voiding and Resistance Change in Open Through Silicon Vias | ![]() |
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Numerical Quantum Transport Studies of Nanostructured Thermoelectrics for Renewable Energy Technology | ![]() |
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Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation | ![]() |
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Parallelization of the Fast Marching Method Using an Overlapping Domain-Decomposition Approach | ![]() |