Professors
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Enhancing Interconnect Reliability by Nano-Twinned Grains | ![]() |
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Green Technology Development with Machine Learning Supported Process TCAD | ![]() |
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Modeling the Reliability of Field-Effect Transistors Based on Two-Dimensional Semiconductors | ![]() |
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Carrier Transport in Nanostructured Semiconductor Devices | ![]() |
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Modeling Emerging Ultra-Scaled Magnetoresistive Memories | ![]() |
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Controlling Single Electrons by Non-Uniform Magnetic Fields | ![]() |
Administration
Researchers
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Influence of Interface Exchange Coupling in Multilayered Spintronic Structures | ![]() |
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Extension of the Deterministic Approach of the Wigner Formalism | ![]() |
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Coherence Limit Due to Hyperfine Interaction with Nuclei in the Barrier Material of Si Spin Qubits | ![]() |
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Investigating the Quality of Insulating Layers as the Origin of Key Reliability Issues | ![]() |
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Ab initio Calculation of Phonon-limited Carrier Mobility in Semiconductor Alloys | ![]() |
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Signed-Particle Monte Carlo Algorithm for Wigner Transport in Linear Electromagnetic Fields | ![]() |
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Improvements of Monte Carlo Algorithms for Electron-Electron Scattering | ![]() |
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Temperature Modeling in Novel MRAM Devices and Its Effects on Switching Characteristics | ![]() |
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Investigating the Hysteresis in the Transfer Characteristics of 2D-MOSFETs | ![]() |
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The Impact of Implantation Conditions on the Dopant Activation and Annealing of Defects | ![]() |
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Switching Efficiency of a Spin-Orbit Torque MRAM Assisted by Voltage-Controlled Magnetic Anisotropy | ![]() |
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Magnetic Spin Hall Driven Field-Free Magnetization Switching of SOT-MRAM Devices | ![]() |
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Modeling Oxide Regrowth During Etching of Vertical 3D NAND Structures | ![]() |
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Growth of CaF2 on Metal Supports and the Search for Alternative Dielectrics | ![]() |
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Developing Specialized Measurement Equipment for Semiconductor Reliability Studies | ![]() |