Professors
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Reliability Assessment of Electromigration in Nanointerconnects | ![]() |
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Electronic Transport in Semiconductor Devices and Nanostructures | ![]() |
Administration
Researchers
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Ongoing Development on the Deterministic Solution of the Wigner Equation | ![]() |
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Long-Term Stability and Positive Aging of Black Phosphorus Field-Effect Transistors | ![]() |
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Advancing the Investigation of Hot-Carriers by Improving the Vienna Monte Carlo Simulator | ![]() |
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Using Temporary Explicit Meshes for Direct Flux Calculation on Implicit Surfaces | ![]() |
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Electromigration Reliability Issues in Interconnects for Three-Dimensional Integration Technologies | ![]() |
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Three-Dimensional Solution of the Boltzmann Transport Equation on Supercomputers | ![]() |
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Advanced Measurement Setup for Single-Defect Spectroscopy | ![]() |
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Evaluation of High Performance Redistancing Methods for Semiconductor Process Simulation | ![]() |